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46results about How to "Enhancing Capacitive Coupling" patented technology

Method of manufacturing a thin dielectric layer using a heat treatment and a semiconductor device formed using the method

In a method for forming a semiconductor device and a semiconductor device formed in accordance with the method, a thin dielectric layer is provided between a lower conductive layer and an upper conductive layer. In one embodiment, the thin dielectric layer comprises an inter-gate dielectric layer, the lower conductive layer comprises a floating gate and the upper dielectric layer comprises a control gate of a transistor, for example, a non-volatile memory cell transistor. The thin dielectric layer is formed using a heat treating process that results in reduction of surface roughness of the underlying floating gate, and results in a thin silicon oxy-nitride layer being formed on the floating gate. In this manner, the thin dielectric layer provides for increased capacitive coupling between the lower floating gate and the upper control gate. This also leads to a lowered programming voltage, erasing voltage and read voltage for the transistor, while maintaining the threshold voltage in a desired range. In addition, the size of the transistor and resulting storage cell can be minimized and the need for a high-voltage region in the circuit is mitigated, since, assuming a lowered programming voltage, pumping circuitry is not required.
Owner:SAMSUNG ELECTRONICS CO LTD

Semiconductor memory and forming method thereof

The invention relates to a grid formation method. The invention comprises a tunneling insulating layer, a first polysilicon layer, a first interlayer insulating layer, a second interlayer insulating layer and a second polysilicon layer,which are formed on a semiconductor substrate in sequence, wherein, the first interlayer insulating layer adopts oxygen-rich silicon nitride, and the second interlayer insulating layer adopts high-K dielectrics. The invention provides a gate structure correspondingly, and also provides a semi-conductor memory and the manufacturing method thereof. Because the invention adopts high-K dielectric material as the second interlayer insulating layer to replace silicon nitride and silicon oxide of the ONO in the prior art, and the dielectric constant of the high-K dielectric material is higher than that of the silicon oxide, the thickness of the high K-dielectric material can be reduced, and therefore the area of a storage unit is reduced, simultaneously the higher coupling ratio is kept between the first interlayer insulating layer and the floating gate, and the higher coupling ratio ensures the programmable voltage to be decreased. Thereby the operating voltage of the flash memory is reduced, and the shorter programming/erasing time can be realized.
Owner:SEMICON MFG INT (SHANGHAI) CORP +1

Compact ultra-wideband omnidirectional antenna

The invention relates to a compact ultra-wideband omnidirectional antenna comprising a first metal layer, a second metal layer and a dielectric substrate. The first metal layer and the second metal layer are printed on the upper layer and the lower layer of the dielectric substrate respectively, and each metal layer is composed of a double-branch flag-shaped radiator, double parasitic bands, a curved groove, a short open-circuit branch knot and a center metal disc. A short branch is loaded on a conical feed structure, the reactance characteristic of the antenna at high frequency is effectively suppressed, a high-frequency resonance point is introduced, and when double parasitic bands are added, a new resonance point is added between two existing resonance points, so that the bandwidth is improved, the 1.8-3.85 GHz passband characteristic is formed. A short open-circuit branch knot is added to the tail end of the first branch knot, a curve-shaped groove is etched, capacitive coupling and a current path are increased, and the low-frequency cut-off frequency is reduced. Finally, the impedance bandwidth of the antenna can reach 78% (1.69-3.85 GHz), in the impedance bandwidth, the cross polarization level on the horizontal plane is smaller than-20 dB, and the efficiency in the working frequency band is 80%-91%.
Owner:CHONGQING UNIV

Method of manufacturing a thin dielectric layer using a heat treatment and a semiconductor device formed using the method

In a method for forming a semiconductor device and a semiconductor device formed in accordance with the method, a thin dielectric layer is provided between a lower conductive layer and an upper conductive layer. In one embodiment, the thin dielectric layer comprises an inter-gate dielectric layer, the lower conductive layer comprises a floating gate and the upper dielectric layer comprises a control gate of a transistor, for example, a non-volatile memory cell transistor. The thin dielectric layer is formed using a heat treating process that results in reduction of surface roughness of the underlying floating gate, and results in a thin silicon oxy-nitride layer being formed on the floating gate. In this manner, the thin dielectric layer provides for increased capacitive coupling between the lower floating gate and the upper control gate. This also leads to a lowered programming voltage, erasing voltage and read voltage for the transistor, while maintaining the threshold voltage in a desired range. In addition, the size of the transistor and resulting storage cell can be minimized and the need for a high-voltage region in the circuit is mitigated, since, assuming a lowered programming voltage, pumping circuitry is not required.
Owner:SAMSUNG ELECTRONICS CO LTD
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