The invention discloses an equal-interval sampling method for spiral scanning type surface topography measurement. A y-direction linear platform, an x-direction linear platform, a z-direction rotating platform, a z-direction linear platform and a laser differential confocal probe are included, and steps 1-6 applying the equipment are also disclosed. Compared with the prior art, the equal-interval sampling method for spiral scanning type surface topography measurement has the advantages that 1) through the equal-interval sampling method, the sampling points on the spiral line are uniformly distributed, each ring of spiral wire does not need so many sampling points, so that the number of the sampling points can be greatly reduced, the sampling data is greatly reduced, therefore, the sampled data occupies less computer memory; and 2) according to the equal-interval sampling method, under the condition that the three-dimensional morphology imaging results are not distorted, the number of sampling points of the equal-interval sampling method is less than that of sampling points of an isochronous sampling method, so that data processed by a computer during three-dimensional morphology imaging is less, and the time consumed by three-dimensional morphology imaging is less.