4 results about "Intensity function" patented technology

The application discloses a kind of information cascade prediction system and method based on the enhanced hawkes process of Transformer, including user embedding module, global dependence module, local dependence module, intensity function acquisition module and popularity prediction module, first, obtain user position-wise embedding and time coding as user embedding, then in the perspective of topological structure, introduce path perception hypothesis, and design two layers of attention layer from two angles of global embedding and local mode, parameterize the intensity function of hawkes process, and combine hawkes process, global embedding and local mode, learn the time and topological random characteristics coupled in information cascade diffusion process, to carry out popularity prediction;The application expands the traditional hawkes process, and effectively obtains knowledge from continuous time domain, improves the accuracy of popularity prediction.

An assist pattern generation method includes selecting a selective region in a mask, calculating an intensity map in the selective region, calculating an intensity function of an analysis region in the selective region, selecting locations of assist patterns and generating the assist patterns, recalculating the intensity function of the analysis region, comparing a first reference value to at least some of differences between first computed values of the intensity function, setting a residue threshold of the intensity function, comparing the residue threshold to at least some of the first computed values of the intensity function, and generating final assist patterns.

An overlay metrology system is disclosed. The overlay metrology system may include a controller having one or more processors. The processor may be configured to execute program instructions to cause the processor to receive a pupil image of collected light from an overlay target and to receive a known phase distribution of an illumination beam to be introduced to the overlay target. The processor may model an intensity function related to the pupil image, the known phase distribution, and one or more eccentricity shift parameters of a structure of the overlay target. The processor may fit the pupil image to the intensity function that depends on the known phase distribution and the eccentricity shift parameter. The processor may generate overlay measurements based on the fit.

A learning method to be executed by a computer according to one embodiment includes of acquiring event history information representing a history of a predetermined event; and training, by using the acquired event history information, parameters of an intensity function in which a trigger function is set to be a function represented by a composite function of a first function and a predetermined second function; and a derivative of the first function, the first function being represented by a neural network that models a temporal change in influence of the event.