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42 results about "Test series" patented technology

Battery pack SOH and RUL prediction method and system based on inconsistency evaluation

InactiveCN111007417AIn line with actual useElectrical testingData-drivenTest set
The invention relates to a battery pack SOH and RUL prediction method and system based on inconsistency evaluation, and belongs to the technical field of battery management. The method comprises the following steps: selecting a to-be-tested series battery pack, and collecting and arranging technical parameters of the series battery pack; and carrying out a cyclic aging condition of multi-section variable current condition charging and constant current discharging, and establishing a battery pack aging database according to data such as single voltage, battery pack voltage, battery pack currentand the like; judging a local charging stage, and extracting a plurality of characteristic parameters based on a voltage change node; evaluating the inconsistency of the battery pack based on the extracted characteristic parameters, and carrying out the multi-input and double-output data-driven regression model training; evaluating the inconsistency of the battery pack by using the test set data;and predicting the SOH and RUL of the battery pack online by using the regression model obtained by training. On the basis of evaluating the inconsistency of the battery pack, the state and the service life of the battery pack are predicted, and the method adapts to incomplete charging and discharging conditions in actual use.
Owner:CHONGQING UNIV +1

Method and system for polishing semiconductor wafers

A method for optimizing CMP (chemical mechanical polishing) processing of semiconductor wafers on a CMP machine. The optimization method includes the steps of polishing a test series of semiconductor wafers on a CMP machine. During the CMP processing, a film thickness is measured at a first point proximate to the center of each respective wafer using a film thickness detector coupled to the machine. A film thickness at a second point proximate to the outside edge of the respective wafers is also measured. Based upon the in-process film thickness measurements at the first point and the second points, the optimization process determines a polishing profile describing a removal rate and a removal uniformity with respect to a set of process variables. The process variables include different CMP machine settings for the polishing process, such as the amount of down force applied to the wafer. The polishing profile is subsequently used to polish production wafers accordingly. For each production wafer, their respective removal rate and removal uniformity is determined by measuring a film thickness at the center of each production wafer and a film thickness at the outside edge of each production wafer using the film thickness detector. Based upon these measurements, the set of process variables is adjusted in accordance the removal rate and the removal uniformity measurements to optimize the CMP process for the production wafer as each respective wafer is being polished.
Owner:NXP BV

Lever type dynamic load test platform with loads adjustable

InactiveCN103196688AMeet the requirements of testing standardsSolution areaStructural/machines measurementEngineeringTest platform
The invention discloses a lever type dynamic load test platform with loads adjustable which is suitable for a loading detecting test on chain block products in the field of hoist machinery. The lever type dynamic load test platform with the loads adjustable adopts a special lever capable of adjusting loads, a framework and an external force source, wherein the framework and the external force source are matched with the special lever. The theories that the product of a force and a force arm equals to the product of a weight and a weight arm, and a fixed pulley can change the transmission direction of the force and a movable pulley can change the transmission speed and the size of the force are utilized, and therefore a complete integral system capable of adjusting the loads is achieved. The requirement for achieving different test loads is met by adjusting the distance between the force arm and the weight arm and the positions of the force arm and the weight arm, so that tests and detection of products of different specifications are achieved. The lever type dynamic load test platform with the loads adjustable has the advantages of being economical, safe, reliable, convenient and simple to operate, and capable of meeting the detection standard requirements of a test piece and improving working efficiency and the like, solves the problem of adjustment under the condition of testing series products with different specifications and different loads on the same test platform, and solves the problems of large occupied area, high manufacturing cost, many weights, difficult operations, low efficiency, high cost, maintenance difficulties and the like. In addition, the problem that an original hydraulic loading condition does not accord with the practical working condition is solved.
Owner:北京起重工具厂

Chip packaging test production line performance control method based on Q-learning reinforcement learning

The invention relates to the field of semiconductor chip packaging test production line performance control and optimization, and particularly relates to a chip packaging test production line performance control method based on Q-learning reinforcement learning. According to the invention, a more accurate semiconductor packaging test series-parallel production line performance prediction model isestablished; and a Morris screening method and an Arena simulation method are comprehensively used for carrying out global sensitivity quantitative analysis, a plurality of influence factors which have the greatest influence on the production line performance and influence rules thereof are obtained, and the conditions that the Markov state space of equipment is huge and traditional mathematical model analysis is not suitable are avoided. According to the method, the variability factors of the production line are controlled on the basis of performance prediction and sensitivity analysis, and the valuing mode of the parameter [epsilon] is improved, so that the convergence rate of the algorithm is higher, local optimization is avoided, and meanwhile, the performance control method has betterflexibility and real-time performance.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Method for carrying out long-distance submarine cable pressure test by using reactive compensation reactor

The invention discloses a method for carrying out a long-distance submarine cable pressure test by using a reactive power compensation reactor. The method comprises the following steps: calculating aparallel compensation inductance value L2 according to reactance values of a land station reactive power compensation reactor and a sea station reactive power compensation reactor; calculating an inductance value L1 of a test series adjustable reactor according to a series-parallel resonance calculation formula when series-parallel resonance is reached; adjusting the inductance value of the test series adjustable reactor according to the calculated inductance value of the test series adjustable reactor 4; setting the frequency of a variable frequency power supply, carrying out slow boost testing, when the reading of the test capacitive voltage divider reaches a test voltage, stopping boosting, keeping the station for preset time, disconnecting the variable frequency power supply to carry out discharging at the end of time so as to complete long-distance submarine cable pressure testing by a reactive compensation reactor. With the method, the alternating-current pressure test can be carried out on the submarine cable, the capacity and the number of field test equipment are relatively small, and the test difficulty and the test cost are relatively low.
Owner:XIAN THERMAL POWER RES INST CO LTD

Power consumption test system and method

The invention provides a power consumption test system and method. The power consumption tester in the power consumption test system is formed by a main control chip, a first digital electronic ammeter and a second digital electronic ammeter, wherein two ends of the sampling resistor of the first digital electronic ammeter and two ends of the sampling resistor of the second digital electronic ammeter are each in parallel connection with two diodes, and the measuring range of the first digital electronic ammeter is greater than the measuring range of the second digital electronic ammeter; the first digital electronic ammeter, the second digital electronic ammeter and the tested electronic device form one series circuit; the main control chip controls on / off of the series circuit; when the series circuit is turned on, the first digital electronic ammeter and the second digital electronic ammeter respectively measures the current value of the tested electronic device in the current state;and the main control chip acquires the first current value of the first digital electronic ammeter and the second current value of the second digital electronic ammeter at the same time. The power consumption test system and method can also measure the current of the tested electronic device in any state, and can avoid the error which is caused when the ammeters are observed by human eyes, thus improving reliability.
Owner:YUNDING NETWORK TECH BEIJING

1045mw ultra-supercritical coal-fired unit boiler blowpipe debugging method and system

The invention relates to a 1045MW ultra-supercritical coal-fired unit boiler blowpipe debugging method and system. After the boiler is flushed in a cold state, the superheater and the reheater are flushed with desuperheating water side pipelines, and the boiler is flushed in a hot state. Control the boiler to increase temperature and pressure, put it into the pulverizing system for test blowing treatment, flush the superheater and reheater with water vapor side pipeline, and purge the high pressure bypass pipeline. Control the boiler to increase the temperature and increase the pressure, carry out the series depressurization and purge of the primary and secondary steam systems, and purge the high-pressure bypass pipes and boiler blowpipe steam pipes. Control the boiler to increase the temperature and increase the pressure, carry out the series depressurization and purging of the primary and secondary steam systems until the target plate inspection meets the preset conditions, and purge the remaining soot-blowing steam pipes of the boiler body and the high-pressure steam inlet pipes of the small machine. Through the blowpipe debugging of the 1045MW ultra-supercritical coal-fired unit, the residues are avoided from causing hidden dangers to the safe operation of the steam turbine generator boiler, and the safety of the coal-fired unit boiler is improved.
Owner:ELECTRIC POWER RES INST OF GUANGDONG POWER GRID

Pressure valve debugging system

The invention provides a pressure valve debugging system, comprising: an oil supply circuit, including at least one oil pump, the output pipeline of the oil pump has a first output node; a pressure regulation test oil circuit, connected to the first output node, used for installation The pressure regulating valve, the pressure regulating test oil circuit includes a flow meter and a pressure detection access point arranged in series between the pressure valve to be regulated and the first output node; the pressure limiting oil circuit is connected to the first output node and is used to limit the Pressure test oil circuit pressure. In the present invention, the pressure valve to be adjusted is connected to the pressure regulating test oil circuit, and the oil supply circuit regulates the pressure and flow of the pressure regulating test oil circuit, that is, the pressure valve to be adjusted adopts a unified connection mode, and the pipeline does not need to be modified during adjustment, thereby Effectively reduce the operation volume of pressure adjustment, solve the problem of limited operating space, and prevent the impact of disassembly and assembly of pipelines on the cleanliness of the hydraulic system; in addition, pressure adjustment operators do not need to understand the working principle of the circuit, reducing the requirements of operators.
Owner:ZOOMLION HEAVY IND CO LTD

Home appliance power supply automatic test device and test method

ActiveCN103630849BMeet the automatic loading and unloading testRealize information productionPower supply testingControl systemTest fixture
The invention discloses an automatic test device and a test method for a power supply of household appliances. The test device includes: at least two test stations, a first transmission module, a manipulator, a suction mechanism, a second transmission module, a main control system, and defective products. Picking mechanism and test fixture; two test stations are connected in series through the second transmission module; the suction mechanism is set on the manipulator; the manipulator is set above the test station, and the main control system is connected with the manipulator to control the manipulator; the main control system It is connected with the defective product picking mechanism and is used to control the defective product picking mechanism; the test fixture is set on the testing station. The invention adopts an independent testing station, and according to the requirements of the product testing process, arbitrarily combines product testing equipment to meet the automatic loading and unloading test of different products, and interacts with the main control system through software to monitor the information of each product in real time and form a record , realize product information production, save production cost and improve production efficiency.
Owner:SICHUAN CHANGHONG ELECTRIC CO LTD

Ground multi-mode force hybrid test platform for small celestial body detection attachment mechanism

The invention relates to a ground simulation test platform for a deep space exploration attachment mechanism, in particular to a ground multi-mode force hybrid test platform for a small celestial body exploration attachment mechanism. Comprising a main body frame, a single attachment unit testing device, a testing platform, a series attachment unit testing device and an integral attachment mechanism testing device, wherein the main body frame is arranged on the testing platform; the single attachment unit testing device is mounted on the main body frame and is used for testing the adsorption rigidity limit of the single attachment unit and the testing platform; the series attachment unit testing device is mounted on the main body frame and is used for testing the attachment and desorption mechanical properties of the series attachment unit mechanism on the simulated rock; the overall attachment mechanism testing device is installed on the main body frame and used for testing the adhesive force mechanical property of the whole attachment device on the simulated rock. The system has the characteristics of high integration level, high flexibility, high measurement and control index precision and the like, the control precision and the safety performance of the system are ensured, and the technical requirements for microgravity coupling and compensation of small celestial bodies are met.
Owner:SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI

Method and system for polishing semiconductor wafers

A method for optimizing CMP (chemical mechanical polishing) processing of semiconductor wafers on a CMP machine. The optimization method includes the steps of polishing a test series of semiconductor wafers on a CMP machine. During the CMP processing, a film thickness is measured at a first point proximate to the center of each respective wafer using a film thickness detector coupled to the machine. A film thickness at a second point proximate to the outside edge of the respective wafers is also measured. Based upon the in-process film thickness measurements at the first point and the second points, the optimization process determines a polishing profile describing a removal rate and a removal uniformity with respect to a set of process variables. The process variables include different CMP machine settings for the polishing process, such as the amount of down force applied to the wafer. The polishing profile is subsequently used to polish production wafers accordingly. For each production wafer, their respective removal rate and removal uniformity is determined by measuring a film thickness at the center of each production wafer and a film thickness at the outside edge of each production wafer using the film thickness detector. Based upon these measurements, the set of process variables is adjusted in accordance the removal rate and the removal uniformity measurements to optimize the CMP process for the production wafer as each respective wafer is being polished.
Owner:NXP BV

A micro-resistance measuring fixture device for detecting metal material damage and its use method

A micro-resistance measuring fixture device for detecting metal material damage and a use method thereof. The micro-resistance measurement fixture device used to detect metal material damage consists of two specimen fixing pieces for fixing metal specimens, two probes for measuring the resistance of metal specimens, and two probes for fixing probes Fixing piece, two screw rods for connecting the specimen fixing piece and the probe fixing piece in series, eight nuts (with washers) for fixing the specimen fixing piece and the probe fixing piece, two pieces for the test piece and the probe fixing piece It is composed of insulating spacers that are insulated between the fixed pieces of the test piece. A micro-resistance measuring fixture device for detecting metal material damage can fix the probe on the end of the test piece to ensure the stability of the resistance measurement reading, detect the slight change in the resistance of the metal test piece under the action of load or environment, and improve the accuracy of the measurement And accuracy, in order to use the resistance change to characterize the damage of the metal material. The invention is applicable to the field of micro-resistance and micro-resistance change measurement.
Owner:XIANGTAN UNIV

Incorporated series connection resonance inductor voltage-dividing high-voltage measurement system

The invention relates to an integrated series resonant inductance voltage dividing high-voltage measurement system, comprising a resonant inductance with a voltage dividing tap, an excitation transformer with a primary side and a secondary side, a first measurement module for measuring the voltage at both ends of the resonant inductance, and a first measurement module for measuring The second measuring module for the voltage across the secondary side of the excitation transformer, an intelligent measuring instrument that is connected to the first measuring module and the second measuring module and sums the voltage across the resonant inductance and the voltage across the secondary side of the excitation transformer, and the excitation transformer The secondary side is connected in series with the resonant inductor and then connected in parallel to both ends of the tested product to form a series resonant test circuit. The present invention utilizes the own reactor of the resonant system, and designs it through the method of voltage dividing taps to make it a resonant reactor with the function of measuring pressure, cancels the AC high-voltage divider configured in the conventional resonant system, and saves investment cost and operating cost , to reduce the loading and unloading workload, especially for ultra-high voltage and ultra-high voltage AC withstand voltage test equipment is of great significance.
Owner:SUZHOU HUADIAN ELECTRIC CO LTD
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