The present invention relates to a device for quickly measuring the verticality of the lip
edge surface and the
handle of a hemispherical
resonator, comprising a hemispherical
resonator, a
workbench, a
comparator and a pin. The hemispherical
resonator comprises a
handle and a hemispherical body, one end of the
handle is fixedly connected to the hemispherical body, and the handle is located at the center of the hemispherical body; the end face of the hemispherical body is a lip edge; the
workbench is a cylindrical table, and a cylindrical hole is opened at the central axis position of the cylindrical table; a probe hole is opened on the side wall of the cylindrical table, and the probe hole is connected to the cylindrical hole, and the probe of the
comparator can be inserted into the probe hole; the handle of the hemispherical resonator is placed in the cylindrical hole, and the lip edge is tightly fitted with the upper end face of the
workbench; the pin is located on the workbench, and is used to limit the positional relationship between the hemispherical resonator and the
comparator. The device used for measurement of the present invention is exquisite, simple, occupies little space, and has low cost, and provides theoretical and practical support for real-time measurement and inspection during the research and
processing of the lip edge of the hemispherical resonator.