The application discloses a kind of for EFlash BIST function
verification method, comprising the following steps: S1, in
register transfer level (RTL) top layer instantiation an EFlash BIST sequence generation module, waiting for
chip power-on reset to enter working state, the test
mode control pin of general input and output interface of
chip is set high, and
chip enters test mode;S2, generate excitation sequence through EFlash BIST sequence generation module and input excitation sequence to BIST interface through general input and output interface, after BIST controller converts excitation sequence into access operation to FLASH module, execute current operation and return operation result data to EFlash BIST sequence generation module to carry out next round operation.The application can ensure the
correctness and reliability of BIST controller function and part FLASH particle function, improve the overall
verification efficiency of chip.