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64results about How to "Mask saving" patented technology

Array substrate, touch screen, touch display device and manufacturing method thereof

The invention provides an array substrate; a driving transistor of a peripheral driving circuit of the array substrate is a bigrid oxide semiconductor transistor; the top grid of the bigrid oxide semiconductor transistor and a touch lead positioned in a display area are formed in the same layer and made of the same material; and furthermore, the material of the top grid is non-transparent metal or alloy thereof having better conductivity, such as molybdenum, aluminium and copper. On the one hand, the bigrid oxide semiconductor transistor can be formed in the peripheral driving circuit in the event that an extra manufacturing process and a photomask are not increased, such that the purpose of controlling the threshold voltage of the oxide semiconductor transistor is realized; on the other hand, a lightproof metal layer is used as the top grid for covering a semiconductor channel region; and thus, photo-generated current can be reduced, such that influence of illumination on the stability of the oxide semiconductor transistor is avoided.
Owner:SHANGHAI TIANMA MICRO ELECTRONICS CO LTD +1

Manufacturing method of super junction device

The invention discloses a manufacturing method of a super junction device. The method comprises the following steps: the step 1, forming a gate structure which is a trench gate, filling a gate trenchwith a polysilicon gate in the forming process of the trench gate, then carrying out first planarization to enable the surface of a first epitaxial layer with the trench gate to be a flat surface, andenabling the width of the gate trench at the leading-out position of the gate structure to meet the requirement of forming a contact hole; and the step 2, forming a super junction in the first epitaxial layer with the flat surface on which the trench gate is formed, wherein in the forming process of the super junction, a second epitaxial layer is adopted to fill the super junction trench, and then secondary planarization is performed, so that the surface of the first epitaxial layer with the super junction is a flat surface. According to the invention, the full-flat process can be realized, the trench gate process can be conveniently arranged before the super junction forming process, and the thermal process after the super junction is formed can be reduced, so that the mutual diffusion of impurities of the super junction is reduced, the device performance is improved, a photomask can be saved, and the process cost is reduced.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Polysilicon active layer-containing thin film transistor, manufacturing method thereof and array substrate

The invention discloses a method for manufacturing a polysilicon active layer-containing thin film transistor, a manufacturing method thereof and an array substrate. The method comprises the following steps of: depositing an amorphous silicon layer on a substrate; patterning the amorphous silicon layer; forming an active layer which comprises a source region, a drain region and a channel region; forming a gate insulating layer and a gate electrode on the upper part of the channel region; depositing an induced metal layer on the substrate on which the gate electrode is formed; doping impurities into the source region and the drain region in an ion injection way, wherein part of the induced metal is bombarded into the source region and the drain region when ions are injected; removing the induced metal layer; performing heat treatment on the doped active layer, so that impurities are activated, and the active layer is subjected to metal-induced crystallization and metal-induced lateral crystallization under the action of the induced metal; and forming a source electrode and a drain electrode. By the method, the preparation time for a polysilicon thin film transistor (TFT) can be shortened; and the manufacturing cost of the polysilicon TFT can be reduced.
Owner:BOE TECH GRP CO LTD

Method of forming CMOS well with mask saved

The invention discloses a method of forming a CMOS well with a mask saved. After exposure and ion implantation on a P-type or an N-type second well are completed, inert ion implantation is further added, the surface of the P-type or the N-type well is in an amorphous state, and implantation of follow-up reversed-type ions can be effectively blocked; then, with the help of a dual-gate mask, implantation on an N-type or a P-type first well is carried out, and as the second well region is protected by the amorphous layer, the second well region is little influenced and the influence can be adjusted back through improving the ion implantation concentration of the second well; and finally, a well annealing process in the traditional technology is used for restoring the amorphous layer on the surface of the second well. The method makes few changes on the CMOS process and is compatible with the traditional technology, the mask can be saved, and the purpose of saving the cost can be finally achieved.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Manufacturing method of embedded flash memory

The invention discloses a manufacturing method of an embedded flash memory. The method comprises the following steps: before forming a low-voltage device and a high-voltage device in a logic region, exposing the source line leading-out position of a source line leading-out region in an etching step of forming a word line in a storage region; during the formation of the grid electrode of the high-voltage device and/or the low-voltage device, by utilizing a protection layer of a first gate oxide layer, removing a first gate oxide layer on an erased gate structure above the source line leading-out position; generating a second gate oxide layer subsequently; utilizing the thickness difference between the first gate oxide layer and the second gate oxide layer, removing the second gate oxide layer and taking the remaining first gate oxide layer as a hard mask; removing one part of the erased gate structure above the source line; removing the remaining erased gate structure during the word line gate etching process and then forming a conductive plug to lead out the source line. In this way, the photoetching step of additionally leading out the source line and a photomask are omitted. Thepurposes of lowering the manufacturing cost of the embedded flash memory and lowering the complexity of the manufacturing process are achieved.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Manufacturing process of SBR (sequencing batch reactor) device capable of realizing charge coupling through three-time masking

The invention discloses a manufacturing process of an SBR (sequencing batch reactor) device for realizing charge coupling through three-time masking. The manufacturing process comprises the following steps: forming a thin oxide layer; forming a body region; forming a thick oxide layer as a first mask; performing photoetching to form a groove; forming a field oxide layer; forming a first polycrystalline silicon; setting a second mask, and etching the first polycrystalline silicon to enable the top of the first polycrystalline silicon to be lower than the surface of the epitaxial layer; injecting source region ions by taking the thick oxide layer between the active region trenches as a mask; depositing to form a first oxide layer; and the first oxide layer is etched downwards in an isotropic manner, so that the epitaxial layer on the surface of the active region is exposed, an active region contact hole is formed in the active region trench, and the active region contact hole extends into the second polycrystalline silicon. According to the manufacturing process, the whole manufacturing process can be completed only through three times of mask, the mask needs to be arranged when the groove is formed, the first polycrystalline silicon is formed and the metal electrode is formed, the mask used when the source region is formed and the body contact region is formed is omitted, and cost is saved.
Owner:捷捷微电(上海)科技有限公司 +1

Thin film transistor array substrate and manufacturing method thereof

The invention discloses a thin film transistor array substrate and a manufacturing method thereof. The method comprises the steps: forming a first photoresist layer on a metal oxide thin film, carrying out exposure and development on the first photoresist layer, keeping the first photoresist layer above a grid electrode to form a first photoresist part, and removing the first photoresist layer at other positions; forming a second metal layer covering the first photoresist part on the metal oxide thin film; forming a second photoresist layer on the second metal layer, exposing and developing the second photoresist layer to form a second photoresist part and a third photoresist part which are separated from each other, and forming an opening between the second photoresist part and the third photoresist part; etching the second metal layer and the metal oxide thin film by using the second photoresist part and the third photoresist part as masks, forming a source electrode and a drain electrode which are spaced from each other after the second metal layer is etched, and forming a metal oxide active layer after the metal oxide thin film is etched; and removing the first photoresist part, the second photoresist part and the third photoresist part.
Owner:KUSN INFOVISION OPTOELECTRONICS

Use the voltage detection circuit on io

The invention discloses a voltage detection circuit on IO. The voltage detection circuit on IO includes a PMOS transistor serial structure which is formed through serial connection of a plurality of PMOS transistors in a diode connection mode, wherein the PMOS transistor serial structure is connected between an input signal and a first node; the source electrode of the first PMOS transistor is connected with the input signal, and the grid electrode of the first PMOS transistor is connected with the first node; a first resistor and a second resistor are connected in series between the drain electrode of the first PMOS transistor and the ground, and the connection point between the first resistor and the second resistor is the second node which outputs a detection signal; a third resistor isconnected between the first node and the source electrode of the second PMOS transistor, and the drain electrode of the second PMOS transistor is connected with the power supply voltage, and the gridelectrode of the second PMOS transistor is connected with the second node, and the source electrode of the second PMOS transistor is a third node; and each PMOS transistor utilizes the transistor technological structure taking the working voltage as the power supply voltage. The voltage detection circuit on IO is implemented by using the transistor technological structure of the power supply voltage, and does not need Zeners so as to save one layer of photomask to save the cost.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Method for manufacturing thin film transistor, and thin film transistor

Disclosed is a method for manufacturing a thin film transistor, and a thin film transistor, relating to the technical field of liquid crystal display. The method comprises steps of: forming a buffer layer, an active layer, a gate insulator layer, and a gate electrode layer successively on a glass substrate and patterning these layers; forming an inter-layer dielectric layer on the buffer layer, the active layer, and the gate electrode layer and patterning the inter-layer dielectric layer; forming a source and a drain on the inter-layer dielectric layer, enabling the source and the drain to come into contact with the active layer, and patterning the source and the drain; forming a passivation layer and an organic photoresist layer successively on the inter-layer dielectric layer, the source, and the drain, and patterning the organic photoresist layer; dry-etching the passivation layer by using the organic photoresist layer as a mask, so as to form a hole on the passivation layer; and forming an organic light-emitting device by means of the hole on the passivation layer. The method saves a mask, requires simple techniques, and saves manufacturing costs. Besides, the developer is not able to come into direct contact with exposed aluminum of the source and the drain resulted from etching of the passivation layer. The method thus achieves the aim of improving product characteristics.
Owner:WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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