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32results about How to "Minimize difference" patented technology

[system and method for analyzing a thin bed formation]

A system and method is disclosed for determining a physical characteristic or property associated with each of a plurality of layers of laminated formation traversed by a wellbore, wherein the laminated formation includes thin beds. The method includes providing one or more high resolution logs of a formation property for the laminated formation. From this log, the bed boundaries are detected and more particularly, the individual beds disposed between the boundaries. Then, the facies for each of the plurality of the beds detected is identified, using one or more high resolution logs of the laminated formation. Each of the identified facies is then defined. This includes importing volumetric descriptions for each of the facies and assigning one of the volumetric descriptions to each of a plurality of the beds detected, wherein each of the volumetric descriptions assigned to a bed is derived from a bed having the same facies. One or more squared logs for formation property is then generated by using the imported volumetric descriptions of the facies for plurality to generate a value of the formation property for each of the beds. This squared log is then convolved to generate a reconstructed log. The reconstructed log is compared with a low resolution log of the formation property for laminated formation. By adjusting the values of the squared log the difference between the reconstructed log and the squared log may be minimized. In this way, and by repeating the adjusting compared steps, and adjusted squared log may be suggested as an optimized squared log of the formation property. The optimized squared logs may then be the subject of a volumetric analyses to generate an output medium having the square log and the volumetric analyses thereon.
Owner:SCHLUMBERGER TECH CORP

Method and apparatus for calibration of indirect measurement systems

A calibration technique is presented for calibrating one or more non-reference indirect measurement systems with respect to a reference indirect measurement system. A reference map function fitting procedure fits a reference map function based on known values of a parameter of interest associated with each of one or more reference calibration samples and corresponding reference values associated with the one or more reference calibration samples measured on or simulated for the reference indirect measurement system. A correction function fitting procedure fits a correction function based on reference values for one or more calibration samples measured on or simulated for the reference indirect measurement system and corresponding values measured on the non-reference indirect measurement system. During normal use, the non-reference indirect measurement system obtains measurements that are indirectly representative of a parameter of interest of an object, corrects the raw measurements using the correction function to corresponding corrected measurements in order to minimize measurement differences between the indirect measurement system and the reference indirect measurement system, and estimates the parameter of interest of the object using the reference map function based on the corrected measurement. Reference map function fitting is typically performed only once, while correction function fitting is updated periodically and independently of the reference map function fitting to account for drift due to systemic, environmental, or other variations.
Owner:AGILENT TECH INC
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