The invention discloses a
microwave substrate defect identification and automatic sorting method, which comprises the following steps of: setting a first
machine position to carry out front and back judgment on a
microwave substrate, and entering a second
machine position when judging that the
microwave substrate is the front side; setting a second
machine position for front detection and positioning, identifying front defects, and determining to enter a third machine position or move into a waste tank according to an identification result; a third machine position is arranged for reverse side detection and
template matching; determining to enter a fourth machine position or move into a waste tank according to a detection result; a fourth machine position is arranged to execute
microwave substrate placement and neat sleeving performance detection; determining whether sorting is completed or not according to a detection result; iDs are generated for each
microwave substrate,
data recording, query and tracing are carried out, and the whole-process
processing quality of the microwave substrates is guaranteed. According to the invention, the whole-process treatment of the
microwave substrate is realized, the product quality consistency and the production efficiency are improved, and higher
economic benefits and
quality management guarantee are brought to enterprises.