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73 results about "Resonance line" patented technology

A resonant line is a line that has standing waves of current and voltage. It is of finite length and is not terminated in its characteristic impedance.

A kind of preparation method of mems atomic vapor chamber and atomic vapor chamber

The invention relates to a preparation method for a micro-electro-mechanical system (MEMS) atomic vapor chamber and the atomic vapor chamber. The chamber is prepared by bonding a Pyrex glass sheet, a silicon wafer and a Pyrex glass sheet by an anodic bonding technology; the Pyrex glass sheet is taken as a window of the chamber; a chamber space is formed by etching or corroding the silicon wafer; paraffin packaged alkali metal such as rubidium (Rb) or cesium (Cs) is put into the chamber, and buffer gas with appropriate pressure is introduced simultaneously; paraffin is taken as a packaging material of the alkali metal, so that active alkali metal is isolated from oxidants such as oxygen, water vapor and the like in an environment; the paraffin is also used as a plating material of the chamber, so that collision between Rb or Cs atoms and a chamber wall is slowed down; and a CO2 laser is used for melting the paraffin to release the alkali metal, so that a uniform paraffin plating is formed on the chamber wall. The problem of long-term drift caused by reaction residues generated by a field preparation mode is solved, the collision between the Rb or Cs atoms and the chamber wall is slowed down, and the contrast of atomic resonance line width of the alkali metal is improved.
Owner:江苏智能微系统工业技术股份有限公司

Photo sensor based on vernier effect of broadband light source and cascading optical waveguide filter

The invention discloses a photo sensor based on the vernier effect of a broadband light source and a cascading optical waveguide filter, which comprises a broadband light source, an input waveguide, a connecting waveguide, an output waveguide, a reference ring-shaped resonant cavity coupled with the input waveguide and the connecting waveguide, a sensing ring-shaped resonant cavity coupled with the connecting waveguide and the output waveguide and two optical power meters. The sensing ring-shaped resonant cavity and the reference ring-shaped resonant cavity are different in optical length; adjacent resonance peaks are not coincident completely when one resonance frequency of the sensing ring-shaped resonant cavity is coincident with one resonance frequency of the reference ring-shaped resonant cavity. At least a part of waveguides in the sensing ring-shaped resonant cavity are influenced by a measured variable or at least a part of waveguides are in contact with a measured substance; the movement of a resonance line can be caused by measured variable influence or measured substance change; and the vernier effect of double resonant cavities can amplify the movement to be movement of total transmission spectrum envelop and can convert the movement into the change of transmission total output power, thereby detecting the measurement substance simply.
Owner:浙江光尖电机技术有限公司

Method used for on-line measurement of density of alkali metal in atom magnetometer air chambers at SERF (spin-exchange relaxation free) states

InactiveCN107192633ARealize online density measurementRealize online measurementSpecific gravity measurementCurve fittingResonance line
The invention discloses a method used for on-line measurement of density of alkali metal in atom magnetometer air chambers at SERF (spin-exchange relaxation free) states. According to the method, an atom magnetometer is provided with a weak background magnetic field and low frequency stage horizontal linear frequency modulated signals, a data collecting card is used for collecting response signals of the atom magnetometer in frequency sweep time; fast Fourier transform is adopted so as to obtain a magnetic resonance curve in a frequency domain, the resonance line width and the resonant frequency of the magnetic resonance curve are obtained via calculation; the background magnetic field is changed so as to obtain a plurality of resonance line widths and resonant frequencies, quadratic curve fitting of the resonance line widths and the resonant frequencies is carried out so as to obtain spin exchange time; and at last the density of alkali metal in atom magnetometer air chambers at the current temperature can be obtained via calculation. The method can be performed at maintained SERF states, on-line measurement of the density of alkali metal in the air chambers can be realized only using the SERF magnetometer; excellent frequency resolution ratio of linear frequency signals can be achieved at low frequency range (1kHz or lower); and the method is suitable for low frequency scanning range required by SERF magnetometer weak magnetic field.
Owner:BEIHANG UNIV

Frequency calibration circuit and method thereof

InactiveCN104135285AReduced operating frequency requirementsIncrease the sampling mechanismPulse automatic controlTotal countPhase locked loop circuit
The invention provides a frequency calibration circuit and a method thereof. The frequency calibration circuit comprises a phase lock loop circuit, an M-dividing divider for generating a plurality of phase signals, a sampling circuit for sampling on the rising edges of the phase signals, a first counter for counting reference frequency signals, a second counter counting first phase signals, a logical control circuit for comparing a count value with a target count value to obtain a minimum difference value, and looking up a control bit of a voltage-controlled oscillator through the difference value, and a comparison circuit for judging whether the control voltage of the voltage-controlled oscillator is in a set range or not. The method comprises the following steps: sampling the reference frequency signals to obtain a total count value; comparing the total count value with a target count value; selecting a next resonance line according to a binary lookup flow till binary lookup ends; and outputting a resonance line corresponding to a minimum error in order that the output frequency of the voltage-controlled oscillator reaches a required value. Through adoption of the frequency calibration circuit and the method thereof, the speed and accuracy are increased, and the requirement on the working frequency of a digital circuit is lowered, so that a design method is simplified.
Owner:SHANGHAI JIAO TONG UNIV

Small-line-width low-loss microwave ferrite material and manufacturing method thereof

The invention discloses a small-line-width low-loss microwave ferrite material, which has a main phase of a garnet structure and a chemical formula of Y3-2xCa2xVxInyMnzFe5-x-y-zO12 or Y3-xCaxGexInyMnzFe5-x-y-zO12, wherein x is more than or equal to 0.01 and is less than or equal to 1.0, y is more than or equal to 0.08 and is less than or equal to 0.5, and z is more than or equal to 0.01 and is less than or equal to 0.06. The invention also provides a method for preparing the small-linewidth low-loss microwave ferrite material. The manufacturing process flow of the method comprises the following steps: 1) calculating and weighing raw materials according to the chemical formula; 2) performing primary wet method ball milling on the raw materials; 3) performing primary sintering; 4) performing secondary wet method ball milling; 5) performing drying and granulating; 6) performing press forming; and 7) performing secondary sintering. The small-linewidth low-loss microwave ferrite material has the advantages of smaller resonance line width (deltaH) and lower dielectric loss (tgdeltae), greatly improves stability and reliability, and enlarges application range; a microwave device made from the small-line-width low-loss microwave ferrite material has better quality; besides, the method has a reasonable process, so that the production cost is further reduced.
Owner:东阳富仕特磁业有限公司

Guided mode resonance grating narrow line width vertical-cavity surface emitting laser (VESEL) and preparation method thereof

InactiveCN107257084AHigh anti-bandwidthHigh inverse bandwidthLaser detailsLaser active region structureMicro nanoVertical-cavity surface-emitting laser
The present invention provides a guided mode resonance grating narrow line width vertical-cavity surface emitting laser and a preparation method thereof. According to the present invention, a guided-mode resonant effect of a micro-nano grating is utilized, and a sub-wavelength guided-mode resonant microcavity structure of high reflection and narrow resonance line width is used as a part of the vertical-cavity surface emitting laser, thereby achieving the purposes of narrower laser line width, wider high reflection bandwidth, smaller size and stable polarization control. According to the present invention, by utilizing the guided-mode resonant effect of the micro-nano grating, and by the equivalent medium theoretical calculation, a weak modulated sub-wavelength grating guided-mode resonant microcavity structure of which the resonant wavelength is 852 nm is designed, and a wall used for controlling the mode line width is added between a grating layer and a waveguide layer, so that the mode line width can reach 1 nm or less. Relative to a conventional VCSEL, the narrow line width vertical-cavity surface emitting laser has the narrower laser line width, the wider high reflection bandwidth, the smaller size and the stable polarization control.
Owner:BEIJING UNIV OF TECH

Method and spectrometer apparatus for investigating an infrared absorption of a sample

A method of investigating a sample (1) having an absorption within an infrared spectral range of interest, comprises the steps of creating measuring light (2) with a light source device (10), wherein the measuring light (2) includes wavelengths covering the infrared spectral range, directing the measuring light (2) through the sample (1) to a detector device (20) with a plurality of detector units (21), (21) each of which comprising an infrared sensitive sensor section (22) and an associated metamaterial resonator section (23) having a specific spectral resonance line (3), wherein the spectral resonance lines (3) of the resonator sections (23) have different frequencies within the infrared spectral range, wherein the measuring light (2) is transmitted through the sample (1) to the resonator sections (23) and subsequently sensed by the sensor sections (22), wherein an output of each of the sensor sections (22) depends on the absorption of the sample (1) at the frequency of the spectral resonance line (3) of the associated resonator section (23), and providing at least one absorption characteristic of the sample (1) on the basis of the output of the sensor sections (22), wherein the sample (1) is arranged for providing near field coupling of electronic states of the sample (1) and photonic resonator states of the resonator sections (23), wherein, for each of the resonator sections (23), a resonance line attenuation is created, which is determined by a complex refractive index of the sample (1) at the frequency of the spectral resonance line (3) of the resonator section (23), and the output of each of the sensor sections (22) is determined by the resonance line attenuation of the associated resonator section (23). Furthermore, a spectrometer apparatus (100) for investigating a sample (1) is described, which has an absorption within an infrared spectral range of interest.
Owner:ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)

High-sensitivity magnetic field measurement method based on electron spin magnetic resonance linewidth narrowing

The invention discloses a high-sensitivity magnetic field measurement method based on electron spin magnetic resonance linewidth narrowing. The method comprises the following steps: step 1, setting adriving light frequency; step 2, performing electron spin magnetic resonance line width measurement; step 3, optimizing the power of driving light; and step 4, optimizing the electron spin density. The high-sensitivity magnetic field measurement method has the beneficial effect that the optically polarized electron spin ground state low ultrafine energy level is driven by high power; magnetic resonance linewidth narrowing is realized by improving the atomic polarizability, so that the magnetic field measurement sensitivity is improved; and the method is particularly suitable for a high-densityand small-size buffer gas chamber. On the one hand, the consistency of the buffer gas chamber is good, the yield is high, and the high-sensitivity magnetic field measurement method is suitable for engineering application; and on the other hand, the whole volume of the atom magnetometer is greatly reduced by adopting a high-density and small-volume air chamber, so that the atom magnetometer is applied to the hot spot fields of magnetoencephalogram, unmanned magnetic anomaly detection and the like; and the application range of the electron spin magnetic field measurement method is widened.
Owner:BEIJING AUTOMATION CONTROL EQUIP INST

Single-beam SERF atom magnetometer and alkali metal atom density measurement method

The invention discloses a single-beam SERF atom magnetometer and an alkali metal atom density measurement method, and the method comprises the following steps: firstly, compensating the magnetic field intensity of the center position of the single-beam SERF atom magnetometer in three directions to zero, and heating an alkali metal gas chamber to enable alkali metal atoms to reach an SERF state; then applying a constant direct-current magnetic field along the direction of one sensitive axis, applying a bias magnetic field with modulation and a bias magnetic field which continuously changes and crosses a zero point along the direction of the other sensitive axis, and recording an output signal of the magnetometer to obtain a magnetic field resonance curve with a dispersion line type; further obtaining the magnetic field resonance line width under different direct-current magnetic fields along the X-axis direction; obtaining the relation between the magnetic field resonance line width and the direct-current magnetic field size through quadratic function fitting; and finally, calculating the alkali metal atomic density by using the quadratic term coefficient of the quadratic function, so that the in-situ measurement of the alkali metal atomic density is realized.
Owner:XI AN JIAOTONG UNIV +1
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