The present invention provides an
antireflection coating composition, which can strongly absorb
radiation of 100 to 300 nm by using the matting resin of the present invention, especially has high light absorption performance at 248 nm, and the
extinction coefficient K reaches 0.4 or more or 0.5 or more, thereby Allows the use of thinner coatings and shorter
etching times, and the prepared anti-reflection
coating material is easy to remove, and is particularly suitable for use in thin-layer photoresists to obtain high-resolution photolithographic patterns; at the same time, the present invention The BARC layer also has an improved
plasma etch rate relative to the
photoresist material, enabling the integrity of the image to be transferred to the substrate for a good
photoresist image. Further, through the interaction of
solid components, the interference effect in the
photoresist can be eliminated; and through the
joint action of the catalyst, the crosslinking agent and the matting resin of the present invention, a kind of photoresist with good storage properties can be obtained. Stable, highly differential
solubility antireflective
coating composition after curing.