The present invention provides an 
antireflection coating composition, which can strongly absorb 
radiation of 100 to 300 nm by using the matting resin of the present invention, especially has high light absorption performance at 248 nm, and the 
extinction coefficient K reaches 0.4 or more or 0.5 or more, thereby  Allows the use of thinner coatings and shorter 
etching times, and the prepared anti-reflection 
coating material is easy to remove, and is particularly suitable for use in thin-layer photoresists to obtain high-resolution photolithographic patterns; at the same time, the present invention  The BARC layer also has an improved 
plasma etch rate relative to the 
photoresist material, enabling the integrity of the image to be transferred to the substrate for a good 
photoresist image.  Further, through the interaction of 
solid components, the interference effect in the 
photoresist can be eliminated; and through the 
joint action of the catalyst, the crosslinking agent and the matting resin of the present invention, a kind of photoresist with good storage properties can be obtained.  Stable, highly differential 
solubility antireflective 
coating composition after curing.