The present invention relates to a two-level comparator circuit, belonging to the technical field of analog integrated circuits. The two-level comparator circuit comprises an input level and a latch level. The input level comprises a first N-channel metal oxide semiconductor (NMOS) transistor (MN1), a second NMOS transistor (MN2), a third NMOS transistor (MN3), a first p-channel metal oxide semiconductor (PMOS) transistor (MP1), a second PMOS transistor (MP2), a third PMOS transistor (MP3) and a fourth PMOS transistor (MP4). The latch level comprises a fourth NMOS transistor (MN4), a fifth NMOS transistor (MN5), a sixth NMOS transistor (MN6), a seventh NMOS transistor (MN7), an eighth NMOS transistor (MN8), a ninth NMOS transistor (MN9), a fifth PMOS transistor (MP5), a sixth PMOS transistor (MP6), a seventh PMOS transistor (MP7) and an eighth PMOS transistor (MP8). Due to reset of a node X+ and a node X- in a latch level circuit, circuit maladjustment and noise are lowered. A pair of cross-coupling transistors MP1 and MP2 is added in the input level circuit, so that the comparator has the characteristic of working at a high-speed. The two-level comparator is applicable to system circuits of high accuracy.