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116 results about "Background level" patented technology

The phrase “background level” is generally used in an experimental context where you are measuring the effect on a variable of some agent or stimulus.

Accurate target detection system for compensating detector background levels and changes in signal environments

An accurate target detection system. The system includes a sensor (22) that receives electromagnetic signals and provides electrical signals in response thereto. A non-uniformity correction circuit (28, 38, 52) corrects non-uniformities in the sensor (22) based on the electrical signals and provides calibrated electrical signals in response thereto. A third circuit (30, 32, 34, 38, 42, 44, 52) determines if a target signal is present within the calibrated electrical signals and provides a target detection signal in response thereto. A fourth circuit (38, 40, 48) selectively activates or deactivates the non-uniformity correction circuit (28, 38, 52) based on the target detection signal. In a specific embodiment, the sensor (22) is an array of electromagnetic energy detectors (22), each detector providing an electrical detector output signal. The non-uniformity correction circuit (28, 38, and 52) includes circuit for compensating for gain, background, and noise non-uniformities (28, 38, and 52) in the electromagnetic energy detectors. The non-uniformity correction circuit (28, 38, and 52) includes a detector gain term memory (28) for storing detector gain compensation values. The detector gain compensation values are normalized by noise estimates unique to each of the detectors. The third circuit (30, 32, 34, 38, 42, 44, and 52) includes a signal enhancement circuit for reducing noise (34, 42) in the calibrated electrical signals. The third circuit (30, 32, 34, 38, 42, 44, and 52) includes a noise estimation circuit (32, 38) that estimates noise in each of the detector output signals and provides noise estimates in response thereto. The noise estimation circuit (32, 38) further includes a noise estimator circuit (38) and a recursive background estimator (32).
Owner:RAYTHEON CO

A fringe illumination Fourier domain iteration updating super-resolution microscopic imaging method based on total internal reflection

The invention discloses a fringe illumination Fourier domain iteration updating super-resolution microscopic imaging method based on total internal reflection. The method comprises the following steps: splitting a parallel illumination laser beam into two parallel beams with equal intensity and consistent polarization direction, and exciting two oppositely propagated evanescent waves to interfereso as to generate a fine evanescent wave fringe illumination fluorescent sample; receiving a fluorescence signal on the imaging image surface by using a detector to obtain a low-resolution image mixedwith high-frequency and low-frequency information of the fluorescence sample; changing the spatial displacement and direction of the evanescent wave illumination fringes for multiple times, and shooting the fluorescence signal modulated by the fringe intensity again to obtain a series of low-resolution images mixed with high-frequency and low-frequency information of the fluorescence sample as original images; and finally, carrying out Fourier domain iteration updating processing on the original image, and carrying out continuous iteration to finally reconstruct a super-resolution image of the fluorescent sample. According to the method, the transverse resolution of about 100 nm can be achieved, the background level can be reduced, the contrast ratio can be improved, the unknown aberration of the system can be corrected, and in-vivo imaging can be achieved.
Owner:ZHEJIANG UNIV
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