2results about How to "Avoid test results" patented technology

This utility model discloses an inspection device for the production of magnetic chucks, relating to the field of magnetic force testing technology. The utility model includes an inspection table with a placement frame fixedly mounted on its top. The placement frame has a placement area and a clamping assembly for holding the magnetic chuck in the placement area. Two sliding rods are fixedly mounted on the placement frame relative to the placement area, and sliding plates are sleeved and slidably mounted on the two sliding rods. An adsorption block is located at the bottom of the sliding plate opposite the placement area. A fixed frame is fixedly mounted on the inspection table, and a lifting plate is slidably mounted on the fixed frame. A cylinder for driving the lifting plate is mounted on the fixed frame, and a tension sensor is fixedly mounted on the lifting plate. A connecting rod is fixedly mounted between the test end of the tension sensor and the sliding plate. A controller is located on the inspection table. This utility model accurately measures the adsorption force using a tension sensor. It has a simple structure, is easy to operate, and can effectively detect the adsorption performance of magnetic chucks, improving inspection efficiency and accuracy.

The utility model discloses an on-off state detection circuit of a magnetic latching relay, which can avoid interference of an external superimposed magnetic field and is reliable and stable in detection result. The magnetic latching relay on-off state detection circuit comprises a first all-pole Hall effect chip, a second all-pole Hall effect chip, a power supply and an MCU. Power supply pins of the first all-pole Hall effect chip and the second all-pole Hall effect chip are respectively connected with a power supply, output pins of the first all-pole Hall effect chip and the second all-pole Hall effect chip are respectively connected with the MCU, and grounding pins of the first all-pole Hall effect chip and the second all-pole Hall effect chip are grounded; wherein the installation position of the first all-pole Hall effect chip is close to a permanent magnet in the magnetic latching relay to be detected and is tightly attached to the magnetic latching relay to be detected, and the installation position of the second all-pole Hall effect chip is far away from the permanent magnet and is tightly attached to the magnetic latching relay to be detected, so that the second all-pole Hall effect chip cannot detect a magnetic field generated by the permanent magnet.