A semiconductor chip fine tuning test device disclosed by the present invention comprises a shell, an inner cavity of a box body is provided with a fixing mechanism, the fixing mechanism comprises a first motor, a first screw rod, a first threaded sleeve, a belt, grooved wheels and a clamping rod, the bottoms of the two grooved wheels are rotatably connected to the two sides of the bottom of the inner cavity of the box body through bearing pedestals respectively, and the clamping rod is connected with the first motor. And clamping rods are fixedly connected to one ends of the two belts correspondingly, and the outer walls of the two clamping rods are slidably connected with the openings in the two sides of the top of the box body correspondingly. According to the semiconductor chip fine tuning test device, through cooperation of a first motor, a first screw rod, a first threaded sleeve, belts, grooved wheels, clamping rods, a through groove and a block body, when the device is used, the two belts can respectively drive the two clamping rods to oppositely move left and right, and through sliding connection of the through groove and the block body, the clamping rods can move left and right; therefore, the two clamping rods can stably clamp and fix the chip, and the problem that the chip is not relatively fixed and is easy to deviate is solved.