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153 results about "Antenna effect" patented technology

The antenna effect, more formally plasma induced gate oxide damage, is an effect that can potentially cause yield and reliability problems during the manufacture of MOS integrated circuits. Fabs normally supply antenna rules, which are rules that must be obeyed to avoid this problem. A violation of such rules is called an antenna violation. The word antenna is something of a misnomer in this context—the problem is really the collection of charge, not the normal meaning of antenna, which is a device for converting electromagnetic fields to/from electrical currents. Occasionally the phrase antenna effect is used in this context, but this is less common since there are many effects, and the phrase does not make clear which is meant.

Low-cost interface structure and method for monitoring direct current side information of solar cell panel

The invention discloses a low-cost interface structure and a method for monitoring the direct current side information of a solar cell panel. The method comprises the following steps of: constructing a low pass filter and establishing a high frequency interconnected channel at the back end of a BOOST circuit booster diode so as to perform digitized carrier communication between a monitoring device and a public direct current bus which is connected with a centralized inverter or a string inverter and performing signal coupling by using double capacitors without any communication transformer orspecial communication line; and processing a mu V level communication signal by using a low transmitting power circuit and a digital phase-locking amplifier and realizing reference signal synchronization and communication frequency switching of the digital phase-locking amplifier through a bus ripple voltage and a bus average voltage so as to reduce the problems of antenna effect and electromagnetic compatibility (EMC) caused by long-distance transportation of a high frequency signal of a direct current bus and lower the cost of a solar panel monitoring communication device. The structure andthe method have good application prospects.
Owner:WUXI MEIKAI ENERGY TECH

Electronic component packaging structure and electronic device

ActiveCN103943610AIncrease planar capacitance densityIncrease planar capacitanceMagnetic/electric field screeningCross-talk/noise/interference reductionCapacitanceAntenna effect
The invention discloses an electronic component packaging structure and an electronic device. The electronic component packaging structure at least comprises a substrate, a conductive housing and a non-conductive adhesive, wherein the substrate is provided with a set adhesion area, the set adhesion area is used for adhesion of an electronic component, the conductive housing is provided with a top and a side wall extending towards the substrate, a bonding end is arranged on the side, close to the substrate, of the side wall, the conductive housing is bonded to the substrate through the bonding end and the non-conductive adhesive, the adhesion area is surrounded by the conductive housing which is bonded to the substrate, a shielding space is formed above the adhesion area, the non-conductive adhesive is located between the substrate and the bonding end, the dielectric constant of the non-conductive adhesive is larger than or equal to seven, and the coating thickness of the non-conductive adhesive is smaller than or equal to 0.07 mm. By the adoption of the electronic component packaging structure and the electronic device, the planar capacitance density of a planar capacitance structure formed by the conductive housing, the non-conductive adhesive and the substrate is improved, then the planar capacitance value of the planar capacitance structure formed by the conductive housing, the non-conductive adhesive and the substrate can be increased, gap antenna effect radiation EMI at the position of the non-conductive adhesive can be effectively reduced, and the EMI shielding effect of the shielding space is improved.
Owner:HUAWEI TECH CO LTD

Semiconductor integrated circuit device

Semiconductor integrated circuit device wherein action for averting antenna effect has been taken, and method for producing a semiconductor integrated circuit device in which action for averting the antenna effect can be taken with ease. The method for producing a semiconductor integrated circuit device includes forming step of forming a semiconductor region of first conductivity type, a first diffusion region of the first conductivity type, formed in the semiconductor region of the first conductivity type, a gate insulating film formed in the semiconductor region of the first conductivity type, gate electrode on the gate insulating film and a wiring layer electrically connected to the gate electrode. The method also includes an investigating step of investigating, following the forming step, into whether or not it is necessary to take an action for averting an antenna effect in the wiring layer. The method also includes an action-taking step of replacing the first diffusion region of the first conductivity type by a second diffusion region of a second conductivity type, in case it is verified in the investigating step that it is necessary to take an action against the antenna effect. The second diffusion region of the second conductivity type forms a pn junction with the semiconductor region of the first conductivity type. The action-taking step also electrically connects the second region of the second conductivity type to the wiring layer.
Owner:ELPIDA MEMORY INC

Plasma induced damage (PID) detection structure and manufacture method thereof

The invention discloses a plasma induced damage (PID) detection structure and a manufacture method thereof. The PID structure comprises a semiconductor substrate, a first coverage, a second coverage, a third coverage and a top coverage, wherein the first coverage is arranged in a first medium layer and comprises a semiconductor device and a protection diode formed on the semiconductor substrate; the second coverage is arranged in a second medium layer and comprises a first wire and a second wire, wherein the first wire is electrically connected with the semiconductor device, and the second wire is electrically connected with the protection diode; the third coverage is arranged in a third medium layer and comprises an antenna structure and a bottom welding pad, wherein the antenna structure is electrically connected with the first wire, and the bottom welding pad is electrically connected with the second wire; the top coverage is arranged in a top medium layer and comprises a top metalline and a top welding pad, wherein the top metal line is electrically connected with the first wire and the second wire; and the top welding pad is electrically connected with the bottom welding pad. According to the PID detection structure and the manufacture method thereof, the strength of antenna effect can be accurately detected.
Owner:SEMICON MFG INT (SHANGHAI) CORP
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