The present application relates to the technical field of device life prediction, and more particularly to a device life prediction method and
system based on working state change curve, the present application proposes the following scheme, by acquiring the working state change curve of the device in the working process, the
resampling of the
flow curve is realized based on the cumulative volume mapping, the
hysteresis back scanning is carried out in the neighborhood of the candidate boundary point, the final boundary point is determined, and the updated equivalent window is constructed. Further, according to the volume difference between the plurality of updated equivalent windows, correction is carried out, when the difference is within the tolerance range, it is directly used, otherwise a correction factor is introduced to correct the updated window, and the self-cleaning
recovery characteristics of the device during the cycle switching are combined to compensate, so that the updated equivalent window more in line with the actual situation is obtained. The attenuation and
recovery process of the device is accurately characterized, and reliable basis is provided for device life prediction and operation and
maintenance strategy.