The invention provides a high-frequency high-
voltage dynamic on-
resistance test circuit and a measurement method of a switching device. The circuit comprises a main circuit and a test
branch circuit,wherein the main circuit comprises a tested switching tube, a load, a current detection
resistor and a power supply; a drain
electrode of the tested switching tube is connected with the load in seriesand connected to a positive
electrode of the power supply, and a source
electrode of the tested switching tube is connected with the current detection
resistor in series and connected to a negative electrode of the power supply; the test
branch comprises a test switch tube and a test
resistor; the drain electrode of the test switch tube is connected in series with the load and is connected to thepositive electrode of the power supply. The
voltage of the test end is controlled by controlling the switching of the tested switching tube; when the tested switching tube is conducted, the
voltage of the test end is the conduction
voltage drop of the tested switching tube; when the tested device is turned off, the voltage of the test end is clamped at a
low voltage. The new test method providedby the invention realizes high-voltage effective clamping, effectively reduces the
voltage overshoot phenomenon caused by charging and discharging of an output
capacitor, introduces a measurement
branch of a zero-voltage zero-
current switch, effectively improves oscillation and improves test precision.