10 results about "Crystal optics" patented technology

The application discloses a method for preparing a ferroelectric crystal optical superlattice by using a pyroelectric effect, a superlattice and application, and belongs to the field of electronic and optical devices. The method comprises the following steps: preparing a ferroelectric crystal material carrying an electrode pattern; heating the ferroelectric crystal material carrying the electrode pattern, and the heating temperature is 50-200 DEG C; in the temperature range, the ferroelectric crystal material carrying the electrode pattern is excited in the reverse direction of polarization by using the pyroelectric property of the ferroelectric crystal material itself; then, an annealing step is performed, and the annealing rate is 50-150 DEG C / h; after 1-10 times of heating and annealing cycles, the superlattice is obtained. The application breaks through the limitation of the external electric field polarization method for different electrode structures by creating a new polarization process, realizes the preparation of different superlattice crystals based on various structure electrodes, and further expands the application scenarios and application fields of the ferroelectric crystal material.

The invention provides a titanium sapphire crystal growth and post-treatment integrated continuous preparation device and method, a heating system of the device is a double-temperature-zone two-section heating body, the temperature gradient in a hearth is controlled through cooperation of an upper-section heating body and a lower-section heating body, and titanium sapphire crystal growth and in-situ constant-temperature annealing are achieved. During crystal growth, Al2O3 and Ti2O3 raw materials are loaded into the crucible, the crucible is integrally placed in the upper-section heating body, the bottom of the crucible is in contact with the heat exchange rod, and parameters such as hearth atmosphere and He gas flow are adjusted to complete crystal growth. And after crystallization is completed, replacing H2 + Ar mixed gas with H2, respectively adjusting the power of the upper and lower heating bodies to form a constant temperature field, and carrying out in-situ constant-temperature hydrogen annealing on the large-size titanium sapphire crystal. The temperature field gradient of crystal growth can be adjusted in real time, the preparation periods of titanium sapphire crystal growth, annealing and the like are shortened, the thermal stress in the crystal is reduced, the Ti < 4 + > concentration in the crystal is reduced, crystal cracking is inhibited, and the optical quality, the FOM value and the yield of the crystal are improved.

The utility model relates to the technical field of crystal testing equipment, in particular to a crystal optical performance testing device which comprises a base. A clamping mechanism is arranged at the top end of the base and comprises a clamping seat, the clamping seat is fixedly connected to the middle of the top end of the base, a clamping block is rotationally connected to the inner side of the clamping seat, clamping cloth is fixedly connected to the tail end of the clamping block, and a protection mechanism is arranged on the outer side of the clamping mechanism. Through the arrangement of the multiple clamping blocks arranged on the inner side of the clamping base in a surrounding mode, the clamping blocks can be combined to form a structure similar to a camera shutter, crystals of different sizes are clamped and fixed through concentric circles of different diameters, and meanwhile the circular structure can provide clamping force for different sides of the crystals; and the crystal particles are automatically positioned to the center of the clamping seat after being clamped, so that the crystal particles are mutually aligned with the test equipment, and the optical test efficiency of the crystal is improved.

This X-ray photoelectron spectrometer is provided with a sample stage 1 having a movement range such that the whole surface of a semiconductor wafer having a diameter of 300 mm or more can be inspected, and an X-ray optical device 2 having the configuration herein described. The X-ray optical device 2 includes a rotating anticathode X-ray source 20 and an X-ray optical system 30 as components. The X-ray optical system 30 extracts X-rays having a specific bandwidth through used of a flat crystal optical system 32 from X-rays collimated by a collimating optical system 31, condenses the X-rays having the specific bandwidth through use of a condensing optical system 33, and irradiates the surface of a semiconductor wafer.

An X-ray photoelectron spectroscopy of the present invention equipped with a sample stage (1) having a movable range where it is possible to inspect the entire surface of a semiconductor wafer having a diameter of 300 mm or more, including an X-ray optical device (2) that is configured to include a rotating anode type X-ray source (20) and an X-ray optical system (30) as components, the X-ray optical system (30) being configured such that X-rays of a specific bandwidth from X-rays collimated by a collimating optical system (31) are extracted by a planar crystal optical system (32), and the X-rays of the specific bandwidth are focused by a focusing optical system (33) to irradiate the surface of the semiconductor wafer with the X-rays.

An optical device may include a bottom surface having a peripheral edge. The optical device may also include one or more first lateral surfaces extending from the peripheral edge of the bottom surface. Each of the first lateral surfaces may meet the peripheral edge at a first interior angle less than 180°. The optical device may also include one or more second lateral surfaces extending from the one or more first lateral sides. Each of the one or more second lateral surfaces may meet a respective first lateral surface of the one or more first lateral surfaces at a second interior angle of less than 180°. The optical device may also include a top end coupled with the one or more second lateral surfaces.

An optical device may include a bottom surface having a peripheral edge. The optical device may also include one or more first side surfaces extending from a peripheral edge of the bottom surface. Each first side may intersect the peripheral edge at a first interior angle of less than 180 DEG. The optical device may also include one or more second sides extending from the one or more first sides. Each of the one or more second sides may intersect with a respective one of the one or more first sides at a second interior angle less than 180 DEG. The optics may also include a tip connected with the one or more second sides.

The invention discloses an optical property prediction method of a fluoride laser crystal based on deep learning, which belongs to the technical field of deep learning and material science and comprises the following steps: constructing a source domain data set of the fluoride crystal with a crystal stability label, and training a source domain model by taking structural parameters and a chemical formula of the fluoride crystal as input to obtain a source domain model; obtaining a crystal stability prediction model; the constructed optical property prediction model comprises a feature extractor and a detection head which are connected in sequence, and the feature extractor is a structure branch GNN and a component branch CoTAN in the crystal stability prediction model; the detection head is used for mapping the features extracted by the feature extractor into a prediction result of the optical properties of the crystal; and inputting the obtained structure parameters and the chemical formula of the fluoride laser crystal to be predicted into the optical property prediction model to obtain an optical property prediction result. According to the method, the crystal stability prediction model is introduced into the optical property prediction process through transfer learning, the problem of scarcity of crystal optical data is solved, and the model prediction precision is improved.

The invention discloses an external low-disturbance gas circulating filtration system of a Czochralski method crystal growth single crystal furnace, which comprises a filtration unit arranged on the outer side of the hearth of the single crystal furnace, and the gas inlet end and the gas outlet end of the filtration unit are respectively communicated with the hearth through pipelines. The external filtering unit is adopted, efficient gas purification can be achieved on the premise that the stability of airflow in the hearth is not affected, the external mode facilitates replacement and maintenance of the filtering unit, meanwhile, the service life of the filtering unit is effectively prolonged, airflow disturbance in the hearth is reduced, and it is ensured that a crystal growth interface is stable and free of turbulence interference; meanwhile, the filtering unit adopts multi-stage filtering, crystal pollution is effectively avoided, and the optical performance of the crystal is improved.

The present application relates to the technical field of optical element detection, and discloses an optical element damage threshold detection system, which comprises a first light source, a switching device, a sample stage, an imaging device and a main controller. The main controller is used to control the switching device to switch the focused optical assembly on any optical mounting position to be located on the main light path of a test light beam. The focused optical assembly on different optical mounting positions comprises a single-lens focusing assembly and a beam-reducing mirror focusing assembly. The light beam shaped by the focused optical assembly is output to a specific point of the measured optical element for damage testing. The damage threshold detection result can be obtained by analyzing the detection images before and after the action of the test light beam using the imaging device. The optical element damage threshold detection system can adapt to the testing requirements of thin film and long crystal optical elements, thereby suppressing the self-focusing of the long crystal and improving the accuracy of the test result.