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54 results about "Ionizing particles" patented technology

Directly ionizing particles are electrically charged particles that have sufficient kinetic energy to produce ionization by collision. These include, but are not limited to, electrons, protons, alpha particles (helium nucleus) and beta particles (high energy electrons).

Air purification device and method

The invention discloses an air purification device. The air purification device comprises a shell, a high-voltage electrostatic dust removal unit and an air blower; the dust removal unit comprises an ionization unit and a dust collecting unit located at a downstream position of the ionization unit; a first gap and a first working voltage are set between the positive electrode and the negative electrode of the ionization unit, wherein the first working voltage is set to be capable of ionizing particles in air passing through the ionization unit, and the first gap is set to be not less than the insulation distance of the air and enable the ionized particles to pass through the ionization unit; and a second gap smaller than the first gap and a second working voltage smaller than the first working voltage are set between the positive electrode and the negative electrode of the dust collecting unit, wherein the second gap and the second working voltage are set to enable the ionized particles to be adsorbed on the electrodes of the dust collecting unit so as to achieve the dust removal function. According to the air purification device, the purification efficiency can be ensured, and the generation amount of ozone can be minimized. The invention further discloses an air purification method.
Owner:刘希威

A method and device for protecting reliability of an electronic device when ionizing particles are bombarded

The invention discloses a method and device for protecting the reliability of an electronic device when ionizing particles are bombarded. The method comprises the following steps: S1, calculating theaverage free path of ionizing radiation particles with different energies acting in the electronic device; S2, according to the grade requirement of the radiation protection and the average free pathof the ionizing radiation particles, determining the size and the air pressure value of the gas device required for radiation protection of the electronic device according to the technical node size of the electronic device; S3, placing the electronic device in the gas device and filling neutral gas with preset pressure; S4, reducing the energy flow density of the incident particles by the collision of the incident particles with the neutral gas in the gas device, and protecting the electronic device from damage caused by particle bombardment. Considering that the main external factor of damaging the electronic device is the strength of the ion energy flow, the invention reduces the energy flow density of the incident particles through the arrangement of the gas device and is combined withthe reliability circuit design, thereby protecting the electronic device from the damage caused by the particle bombardment and improving the reliability thereof.
Owner:ETOWNIP MICROELECTRONICS BEIJING CO LTD
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