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223 results about "Critical regions" patented technology

Critical Region. Critical Region refers to a set of values that will cause a researcher to conclude that the treatment or intervention she applied has a significant effect on the variable being investigated. Values that fall in the Critical Region signify that the results obtained represent a real difference, and could not have occurred by chance.

Apparatus and methods for determining critical area of semiconductor design data

Disclosed are mechanisms for efficiently and accurately calculating critical area. In general terms, a method for determining a critical area for a semiconductor design layout is disclosed. The critical area is utilizable to predict yield of a semiconductor device fabricated from such layout. A semiconductor design layout having a plurality of features is first provided. The features have a plurality of polygon shapes which include nonrectangular polygon shapes. Each feature shape has at least one attribute or artifact, such as a vertex or edge. A probability of fail function is calculated based on at least a distance between two feature shape attributes or artifacts. By way of example implementations, a distance between two neighboring feature edges (or vertices) or a distance between two feature edges (or vertices) of the same feature is first determined and then used to calculate the probability of fail function. In a specific aspect, the distances are first used to determine midlines between neighboring features or midlines within a same feature shape, and the midlines are then used to determine the probability of fail function. A critical area of the design layout is then determined based on the determined probability of fail function. In specific implementations, the defect type is a short type defect or an open type defect. In a preferred implementation, the features may have any suitable polygonal shape, as is typical in a design layout.
Owner:KLA TENCOR TECH CORP

Image type automatic analysis method for mesh adhesion rice corn

InactiveCN101281112AOvercoming problems that are difficult to analyze automaticallyRemove the restriction of non-stick placementImage analysisMaterial analysis by optical meansAutomatic segmentationSplit lines
The invention discloses an image automatic analysis method for reticulate adhesion rice. The method firstly images rice under the grade of a reference backlight, and enables the reticulate adhesion rice to belong to the different local regions separately through an automatic segmentation. Secondly, the automatic segmentation includes that fat circular rice is carried on a distance transformation and a watershed transformation to be divided, as well as to use a circular template to get the concave angle point of long rice after the long rice is carried out watershed transformation, and the separation line can be determined and the wrong separation line can be removed according to the concave angle point. Different colors is using to color complete polished rice, broken rice and the rice whose length is in the critical region and to color background and chalkiness so as to figure out the grain number, the length, the width and the length to width ratio of each grain, finally, and the entire polished rice rate, the broken rice rate, the chalkiness degree and the chalkiness grain rate, and to form an analysis report. The invention overcomes the problem that the reticulate adhesion rice is difficult to be carried on automated analysis, and removes the limit of the request analysis sample is not in adhesion placing.
Owner:ZHEJIANG SCI-TECH UNIV
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