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3results about How to "Accurate exclusion" patented technology

Display screen defect detection method, device and system, electronic equipment and storage medium

PendingCN121982378AAccurate defect detection resultsAccurate exclusionImage analysisCharacter and pattern recognitionComputer graphics (images)Engineering
The invention discloses a display screen defect detection method, device and system, electronic equipment and a storage medium, and belongs to the technical field of defect detection. The method comprises the steps that a first image and a second image of a display screen are acquired, the first image is an image when the display screen is in a lightened state, and the second image is an image when the display screen is in an extinguished state and is irradiated by a light source; performing image fusion on the first image and the second image to obtain a target fusion image; the target fusion image is input to a target classification model, a defect classification result output by the target classification model is obtained, the defect classification result is used for representing whether the defect of the target fusion image is an appearance defect, and the target classification model is a pre-trained deep learning classification network; and determining a defect detection result of the display screen based on the image data of which the defect classification result is non-appearance defect. According to the method, external interference factors such as dust can be accurately removed, the first pass yield of product detection is remarkably improved, and the over-killing rate is effectively reduced.
Owner:苏州凌云光工业智能技术有限公司 +1

A method and system for monitoring industrial waste gas based on intelligent sensing

This invention provides an industrial waste gas monitoring method and system based on intelligent sensing. The method includes: collecting waste gas composition data and gas flow rate data, and determining predicted waste gas composition data through a waste gas treatment efficiency prediction model; determining a waste gas treatment time window, and then determining waste gas composition treatment efficiency indicators and waste gas early warning indicators, generating waste gas treatment prompt information and determining the waste gas early warning type. According to this invention, by setting waste gas composition sensors at multiple stages and considering the impact of gas flow rate on treatment efficiency, the waste gas composition treatment efficiency indicators can be determined through a waste gas treatment efficiency prediction model. This provides a basis for judging whether there are faults in each stage, and can also calculate waste gas early warning indicators to determine whether the overall waste gas treatment status meets the standards. In the event that waste gas treatment does not meet the standards, a prompt message can be generated, indicating the faulty stage, which is beneficial for accurately troubleshooting and reducing pollutant emissions.
Owner:SHANGHAI XINZHI ELECTROMECHANICAL ENG CO LTD

A device for checking the cutting of silicon wafers

ActiveCN224618791UAccurate exclusioneasy to operate
This utility model belongs to the technical field of photovoltaic industry and discloses a feeding device that also inspects silicon wafers. It includes a feeding frame, with a feeding robot and a vision camera group for inspecting silicon wafers mounted on the upper part of the feeding frame. The vision camera group is located at the front end of the feeding robot. A bottom support plate is mounted on the bottom of the feeding frame, and a waste removal conveyor roller, a positioning conveyor roller, and a gripping conveyor roller are sequentially arranged on the bottom support plate. A buffer box is located at the end of the gripping conveyor roller, and a sorting machine conveyor roller is located on the adjacent side of the gripping conveyor roller. A waste removal and lowering drive assembly is located below the waste removal conveyor roller to tilt the waste removal conveyor roller downwards, allowing unqualified silicon wafers to enter the waste box. The waste box is also equipped at the front end of the waste removal and lowering drive assembly.
Owner:LIANZHI (DALIAN) INTELLIGENT TECH CO LTD