The invention discloses a
system for performing dynamic and short-circuit testing on an intelligent
power module. The
system comprises a control module, a
driving circuit and a power circuit. The control module firstly generates a control instruction and sends the control instruction to the power circuit, and then generates a
control signal and sends the
control signal to the driving module; meanwhile, according to the received waveform data and the waveform data of the
control signal, a plurality of parameters required by the
test item are calculated. The drive circuit isolates the control
signal and then outputs the control
signal to the tested intelligent
power module, and the tested intelligent
power module turns on or turns off the IGBT according to a
time sequence. The power circuit is connected with each IGBT of the tested intelligent power module, is communicated with a
test channel of the corresponding IGBT according to a received control instruction, collects the waveform data of the current of the IGBT and the CE end
voltage in the test process, and sends the waveform data to the control module. According to the invention, through automatic switching between channels, automatic acquisition of parameters and automatic calculation of parameters, dynamic parameter testing and short-circuit parameter testing of an intelligent power module product are realized.