64 results about "Spectral response function" patented technology

A method of performing mass spectral analysis involving at least one of the isotope satellites of at least one ion, comprising acquiring a measured mass spectral response including at least one of the isotope satellites; constructing a peak component matrix with mass spectral response functions; performing a regression analysis between the acquired mass spectral response and the peak component matrix; and reporting one of statistical measure and regression coefficients from the regression analysis for at least one of mass spectral peak purity assessment, ion charge determination, mass spectral deconvolution, and mass shift compensation. A method for the identification of an ion in a sample through acquired MS scans, comprising obtaining an isotope pattern of an ion; constructing a projection matrix based on the isotope pattern or MS scan; projecting the isotope pattern or MS scan onto the projection matrix to calculate at least one of projection residual and projected data; and performing a statistical test on at least one of the projection residual and projected data to determine if the ion exists in the sample or if there is interference. A method which takes advantage of mass defect or isotope pattern analysis, and software and hardware for implementing all aspects of the invention.

The invention relates to an apparatus for determining a detector energy weighting function of a detection unit (6). The apparatus comprises a determination unit (21) for determining a spectral response function of the detection unit (6) and a calculation unit (22) for determining the detector energy weighting function by integrating the product of the spectral response function of the detection unit (6) and a given ideal detector energy weighting function.

A method for estimating an input spectrum from sensor data acquired by an optical sensor assembly, having an aperture, a Fabry-Perot interferometer, and an optical sensor element, the method including: obtaining first calibration data representative of a spectral response function of the optical sensor assembly for a first setting of the aperture; computing second calibration data from the first calibration data, the second calibration data being representative of a spectral response function of the optical sensor assembly for a second setting of the aperture, where the second setting corresponds to a setting applied during the acquiring of the sensor data; and estimating the input spectrum as a function of the second calibration data and the sensor data. Additionally, a corresponding system for estimating an input spectrum.