The invention discloses a micro-area scanning imaging device and a measuring method. The micro-area scanning imaging device comprises a
laser, a double-axis scanning
galvanometer SM, a cubic
beam splitter CB and a
microscope objective OB, wherein the double-axis scanning
galvanometer SM gathers
laser on a sample S. The cubic
beam splitter CB splits
signal light reflected after the
laser irradiates the sample S to a sample
signal detector SD; a plate-
shaped beam splitter PB is also arranged between the cubic
beam splitter CB and the sample
signal detector SD, so that the
signal light is further split to the laser
detector PD; in the measurement process, a two-dimensional characteristic optical signal graph of the surface of a sample S is obtained based on a sample
signal detector SD, then a blank substrate is placed in a to-be-measured area, a two-dimensional reflected
light signal graph in the same area as the sample S on the substrate is obtained based on a laser detector PD, the two-dimensional characteristic optical signal graph is subjected to normalization
processing based on the two-dimensional reflected
light signal graph, and the normalized two-dimensional characteristic optical signal graph is obtained. And obtaining a normalized two-dimensional characteristic optical signal graph, and further drawing a two-dimensional space scanning graph of the physical properties of the sample S. The device and the method are suitable for
signal acquisition of
fluorescence spectrum, Raman spectrum, second
harmonic and the like, and high-resolution imaging of various material microcells is realized by performing two-dimensional
laser scanning on the surface of a sample.