The invention provides a high-resolution
light guide plate image defect detection method, including the following steps: the original picture of the
light guide plate is collected, a
light guide plateoriginal image is enhanced, a maximum inter-class
variance method is used for threshold segmentation of that
image enhancement image of the light guide plate, the connected domain is obtained from the threshold
processing display graph, a light guide plate whole connected region is extracted with that lar area, a maximum area extraction graph is transformed into a shape, a light guide plate imageshape conversion map is adjusted in a gray value, the gray value adjustment map is partitioned,
Gaussian bias is applied to the partition display image of the light guide plate, a
mask process is performed on the
Gaussian partial derivative display image, Fourier positive transform is carried out on the
mask processing display graph, a sinusoidal shape band-pass filter is established, inverse
Fourier transform is carried out on the
convolution display graph, threshold treatment is carried out on the inverse
Fourier transform display graph, the connected domain is obtained on the second threshold treatment display graph, defects are extracted on the second connected domain display graph, and defects are displayed.