2 results about "Nano grid" patented technology

The invention relates to a step-changing conductive high-transmittance micro-nano grid photoelectric glass window and a processing method thereof, and the processing method comprises the following steps: design of a photoelectric glass window structure: the transmittance of the photoelectric glass window is greater than or equal to 85%, the sheet resistance is less than 100 omega / square, and a network structure is designed based on the design; a mask plate is prepared, wherein the designed grid structure is prepared into the mask plate; surface treatment: plating an antireflection film layer on the photoelectric glass window; manufacturing the structure: spin-coating anti-reflection glue and photoresist on the antireflection film layer to obtain photoelectric glass with a glue layer; placing the photoelectric glass with the adhesive layer under a mask plate for exposure to obtain a designed grid structure; transferring the structure: performing partition etching on the grid structure to obtain a photoelectric glass grid window with stepped groove depth; and finally, carrying out zoning coating. According to the step-changing conductive high-transmittance micro-nano grid photoelectric glass window, the problem of photoelectric conversion loss when the photoelectric glass window is coupled with a photoelectric cathode can be solved, and the electron loss can be reduced to be lower than 5%.

The present invention relates to a circular molybdenum nanogrid sample support having an upper and lower dual silicon post structure and belongs to the field of high-precision sample support technology used in electron microscope analysis equipment. The sample support of the present invention has a structure in which two circular molybdenum (Mo) bodies are precisely interlocked and joined, and within this structure, silicon (Si) posts of various shapes are arranged at the upper and lower portions, respectively. Through this upper and lower dual silicon post structure, two samples can be simultaneously fixed and TEM, SEM, or FIB analysis can be performed using a single loading process, thereby maximizing analysis efficiency. Furthermore, the uppermost portion of the silicon posts can be processed into a flat or D-cut shape; this D-cut shape may or may not penetrate downwards, and allows for uniform or non-uniform shape distribution between the posts, enabling adaptation to various sample shapes and analysis purposes. The circular molybdenum nanogrid sample support of the present invention simultaneously secures high mechanical strength and conductivity, and enables precise mass production through semiconductor process-based MEMS technology. Thus, the present invention provides excellent technical effects in terms of simultaneous analysis of multiple samples, reduction of background noise, reprocessing of samples, and compatibility with various analytical instruments.