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127results about How to "Reduce switching speed" patented technology

Low-offset and fast-response voltage-controlled current source, control method and power circuit applying voltage-controlled current source

The invention relates to a low-offset and fast-response voltage-controlled current source. In the voltage-controlled current source which is realized by adopting an operational amplifier, an input offset voltage which is larger relative to an input reference voltage is reduced to an acceptable range through use of an automatic zeroing method, and the output error of the voltage-controlled current source is reduced. The slew rate of the operational amplifier is improved by adding a sampling hold circuit so as to realize the fast response of a circuit. The low-offset and fast-response voltage-controlled current source is especially suitable for applications, such as an LED driving circuit, requiring fast response. In addition, the input offset is reduced by adopting the automatic zeroing method, the low input offset of the voltage-controlled current source can be realized by adopting a standard CMOS (Complementary Metal Oxide Semiconducotr) process, the change of the input offset along with the changes of temperature, time, illumination and irradiation is unnecessarily considered, and the requirement on layout matching is lower, therefore the production cost and time are reduced.
Owner:SILERGY SEMICON TECH (HANGZHOU) CO LTD

SiC MOSFET power device and preparation method thereof

InactiveCN110350035AReduced on-resistance and on-power dissipationReduce input capacitanceSemiconductor devicesCapacitanceMOSFET
The invention provides a SiC MOSFET power device and a preparation method thereof. The device comprises a substrate, an epitaxial layer, a trench, a gate dielectric layer, a gate conductive layer, a well region, a source region, a body contact region, an SBD diode region, a front metal layer and a drain metal layer, wherein the epitaxial layer is positioned on the surface of the substrate; the trench is located in the epitaxial layer, and the upper opening of the trench is larger than the lower opening of the trench; the gate dielectric layer is positioned on the side wall and the bottom surface of the trench; the gate conductive layer is located on the surface of the gate dielectric layer and fills the trench; the well region is located in the epitaxial layer and is located on the periphery of the trench; the source region is located in the well region; the body contact region is located in the well region; the SBD diode region is located in the epitaxial layer. According to the device, the structure of a traditional SiC MOSFET power device is optimized, so that the conduction resistance and the conduction power consumption of the device can be reduced, and the device can also have a relatively low input capacitance, the switch speed of the device is increased, the power consumption of the switch is reduced, the reverse conducting capability of the device is improved, and theoverall size and the economic cost of the power module are reduced. The structure and the method are simple, and a wide application prospect is achieved.
Owner:上海功成半导体科技有限公司

Manufacturing method of groove-type super junction device

The invention discloses a manufacturing method of a groove-type super junction device. The method comprises the steps of: providing a semiconductor substrate, wherein a first conductive type epitaxial layer is formed on the surface; forming a plurality of first grooves in the first conductive type epitaxial layer; filling the first grooves with a second conductive type epitaxial layer in an epitaxial growth process; carrying out a chemical and mechanical grinding process to form a super junction; forming a P type body area on the surface of the super junction, wherein the depth of the P type body area meets the requirements that all kinds of crystal lattice defects caused by epitaxial filling are surrounded, and each defect is arranged outside a depletion area of the reverse bias process of the P type body and an N type film layer; forming a second groove whose depth is larger than the P type body area; and forming a gate medium layer on the bottom surface and the side surface of the second groove, and filling the second groove with polysilicon grids. According to the invention, the negative influences caused by the epitaxial filling process on the super junction device are avoided, the reverse leakage current of the super junction device is reduced, and the production yield rate of the super junction device is improved; in addition, parasitic capacitance is reduced, and the electromagnetic interference performance of the circuit and the system is improved.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Super junction semiconductor device with optimized switching characteristic and manufacturing method

ActiveCN106158927AAdding input capacitanceReduce the value of dV/dtSemiconductor/solid-state device manufacturingSemiconductor devicesCapacitanceBody area
The invention relates to a super junction semiconductor device with the optimized switching characteristic and a manufacturing method. The super junction semiconductor device is characterized that integrated capacitor areas are introduced into the surface of a trench gate type super junction semiconductor device, and each integrated capacitor comprises a gate capacitor plate, a first insulating medium layer and a second conduction type body area, wherein the areas, adjacent to a semiconductor substrate, of the first insulating medium layers in the section direction of the semiconductor are the second conduction type body areas, the first insulating medium layers are provided with the gate capacitor plates which are adjacent to one another, and the gate capacitor plates are electrically communicated with gate electrodes. According to the device, by introducing the integrated capacitor areas, the input capacitance Ciss of the device can be effectively increased, but the feeback capacitance Crss and the output capacitance Coss of the device are invariable, therefore, the ratio of the feedback capacitance Crss to the input capacitance Ciss is decreased, then the switching characteristic of the device is improved, and the ratio of dV to dt in the switching process is decreased; in addition, the manufacturing method of the device is compatible with an existing semiconductor technology, preparation of the integrated capacitor areas can be completed on the premise that no technological step is added, and therefore cost is not increased.
Owner:WUXI NCE POWER
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