Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

43 results about "Energy-dispersive X-ray spectroscopy" patented technology

Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and a sample. Its characterization capabilities are due in large part to the fundamental principle that each element has a unique atomic structure allowing a unique set of peaks on its electromagnetic emission spectrum (which is the main principle of spectroscopy).

Detection method for microscopic lithium precipitation from cycles of lithium ion battery

The invention discloses a detection method for microscopic lithium precipitation from cycles of a lithium ion battery. The detection method comprises the following steps: firstly, discharging a to-be-detected lithium ion battery; disassembling the lithium ion battery after discharging, taking out an anode piece and cleaning the anode piece to remove residual electrolyte; exposing the anode piece to the air for 5-20 h, performing heating and drying at 60-110 DEG C for 1-3 h, and converting precipitated lithium into lithium carbonate finally; measuring corresponding data by EDS (energy-dispersive X-ray spectroscopy) or chemical titration to determine the degree of lithium precipitation in the anode piece. Compared with the prior art, the method has the following advantages that the detectionrange is wide, the method is applicable to detection of microscopic lithium precipitation, and the degree of lithium precipitation can be judged visually based on specific data obtained by detection;detection convenience is higher, external interference of detection data is low, requirements of the detection method for equipment are low, and the detection cost is low; the method is applicable toanalysis of lithium precipitation from cycles of various lithium ion batteries such as LFP, NCM, LMO and the like.
Owner:ETRUST POWER ETP GRP LTD

Chemical modification method of aromatic diazo salt to ZnO nanostructured surface

The invention relates to a chemical modification method for a surface of ZnO nanostgructure with aromatic diazo salt, belonging to the functional material and surface chemistry field. The method comprises the steps that: ZnO with the nanostructure is immersed in absolute ethyl alcohol, is subject to the ultrasonic processing, washed by deionized water for ultrasonic washing, taken out and dried in nitrogen environment; under the condition of keeping out of light, the processed nano ZnO is immersed in actonitrile of aromatic diazo salt for 18 to 36 hours at a temperature of 10 and 50 DEG C; the nano ZnO modified by the aromatic diazo salt is taken out from solution, is irradiated through an ultraviolent lamp or heated, and kept for a period of time; and the nano ZnO is washed orderly with the acetonitrile, acetone and ethanol, dried in the nitrogen environment and the modification is completed. The method is simple and feasible; and the modified ZnO nanostructure is more stable, can resist the corrosion of the chloroform, the ethanol, the acetone, methylene dichloride and other various organic solvent, the content of organic carbon reaches more than 10 percent through the analysis to the modified surface with an energy dispersive x-ray spectroscopy.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX) detection method for distribution characteristics of nitrogen, phosphorus and potassium in crop leaf

The invention discloses a scanning electron microscope-energy dispersive X-ray spectroscopy (SEM-EDX) detection method for distribution characteristics of nitrogen, phosphorus and potassium in a crop leaf. The SEM-EDX detection method adopts a way of combining SEM with EDX to carry out surface scanning on a leaf cross section and line scanning of the thickness direction to obtain an energy spectrum diagram of nitrogen, phosphorus and potassium in the crop leaf, and then analyzing the energy spectrum diagram to obtain space distribution characteristics of nitrogen, phosphorus and potassium in a mesophyll tissue. Nitrogen, phosphorus and potassium are distributed in the whole leaf cross section, the distribution characteristics of nitrogen and phosphorus are similar, the distribution densities of nitrogen and phosphorus along the periphery of a cell wall contour are obviously higher than the distribution densities of other parts; potassium is distributed relatively uniformly in the whole leaf cross section. The SEM-EDX detection method disclosed by the invention solves the problem that the space distribution characteristics of nitrogen, phosphorus and potassium in the leaf cannot be determined, and can be applied to the microscopic detection of crop nutrients.
Owner:JIANGSU UNIV

Spectroscopy technique using merged spectral data

A method of examining a sample using a spectroscopic apparatus, such as energy-dispersive X-ray spectroscopy (EDX), comprising the following steps: - Mounting the sample on a sample holder; - Directing a focused input beam of radiation, such as an electron beam or X-ray beam, onto a location on the sample, thereby producing an interaction that causes a flux of stimulated photonic radiation, such as fluorescent X-rays, to emanate from said location; - Examining said flux using a multi-channel photon-counting detector, thus accruing a measured spectrum for said location; - Automatically repeating said directing and examining steps for a series of successive locations on the sample, which method comprises the following steps: - Choosing a beam parameter of the input beam, such as the beam curent or beam spot size, that will influence a magnitude of said flux of stimulated photonic radiation; - For each location within a first set of locations on the sample, accruing a spectrum using a first value of said beam parameter; - For each location within a second set of locations on the sample, accruing a spectrum using a second value of said beam parameter, different from said first value. One application consists in detecting and flagging events during EDX analysis when pile-up is too high and re-acquire EDX data for the locations corresponding to these flagged events.
Owner:FEI CO
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products