The invention discloses a method and a measuring
system for solving
birefringence phenomenon double-light tracks of a
uniaxial crystal, and the method comprises the steps: defining a front surface normal vector, a rear surface normal vector and an
optical axis direction vector of the
crystal, and representing the spatial orientation of the
crystal through the rotation operation around an x axis and a y axis; calculating a normal vector and an
optical axis direction vector after rotation according to the rotation angle of the
crystal around the z axis; based on the
refraction law, the Snell law and the Fresnel equation, the propagation directions of the o light and the e light in the crystal are deduced; considering the
refraction behavior of the rear surface of the crystal, and respectively calculating direction vectors after the o light and the e light are emitted; and determining the coordinates of the o light and the e light on the observation screen by utilizing a point equation and combining a
ray tracing method, and rotating the crystal for one circle to generate a dual-light trajectory. According to the method, any
crystal rotation operation is processed through a unified coordinate
system, and the calculation complexity of a complex scene is reduced; the systematic intersection solution
algorithm provided by the invention is combined with the e
light wave vector / light separation calculation model, so that the
light spot positioning efficiency is improved.