Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

91 results about "Bias effect" patented technology

Belief-Bias Effect. The Belief-Bias Effect refers to the results that happen when an individual’s own values, beliefs, prior knowledge, etc. affects, or distorts, the reasoning process through the acceptance of invalid arguments or data.

Temperature measurement correction system and method for thermal infrared imager

InactiveCN109655162AAdaptableAvoid temperature measurement errorsRadiation pyrometryOptical ModuleEmissivity
The invention provides a temperature measurement correction system and method for a thermal infrared imager. The system includes an infrared optical module, a plane black body and a high and low temperature box arranged in the thermal infrared imager, wherein a focal plane of the to-be-corrected thermal infrared imager is aligned with the plane black body through the infrared optical module, radiation of the plane black body is uniformly irradiated on the focal plane, a preset distance between the to-be-corrected thermal infrared imager and the plane black body is kept, the to-be-corrected thermal infrared imager is placed in the high and low temperature box for preheating, and subsequent calibration is performed after the temperature is stabilized. The system is advantaged in that the distance of a measured object is compensated by an optical system, influence of surface emissivity of the measured object and the environment temperature on temperature measurement is compensated by thecorrection method, the thermal infrared imager is made to be more adaptable to the measured object and the environment, gain and the bias effect of the thermal infrared imager on external radiation under different temperatures are accurately calibrated, a temperature measurement error caused by temperature change of an instrument in the temperature measurement process is avoided, an additional device such as a shutter is not needed for calibration, and the structure of the instrument is simplified.
Owner:INNO INSTR (CHINA) INC

Photocatalytic wastewater fuel cell capable of strengthening free radical reaction, and preparation method and application of photocatalytic wastewater fuel cell

The invention relates to a photocatalytic wastewater fuel cell capable of strengthening a free radical reaction. The photocatalytic wastewater fuel cell comprises a photo-anode, a cathode, persistent organic pollutant wastewater, a light source, an electrolyte solution, a quartz reaction pool and an air vent, wherein the photo-anode and the cathode are respectively inserted into the electrolyte solution, which contains the persistent organic pollutant wastewater, in the quartz reaction pool, and are connected by an external circuit; 0.1-0.4mM ferrous ions are added into the electrolyte solution, and the pH value is adjusted to be 1.0-4.0; the cathode is close to the air vent which is continuously filled with air; the light source is turned on for irradiating the photo-anode and the cathode; the ferrous ions have a Fenton-like circular reaction with free radicals and related substances which are generated on the surfaces of the photo-anode and the cathode under the automatic bias effect of the photocatalytic fuel cell, so that the free radical reaction in a system is strengthened, and the performance of the photocatalytic fuel cell is greatly improved. The invention provides a more efficient and economical wastewater treatment and energy recovery method, and has a wide application prospect.
Owner:SHANGHAI JIAO TONG UNIV

High frequency switch circuit for inhibiting substrate bias effect in sampling hold circuit

InactiveCN101783580AGood linearity of equivalent resistanceImprove the signal-to-noise-distortion ratioPower conversion systemsEngineeringLinearity
The invention discloses a high frequency switch circuit for inhibiting substrate bias effect in a sampling hold circuit, comprising a first substrate bias-inhibiting high frequency switch unit, a second substrate bias-inhibiting high frequency switch unit and a transmission gate switch, wherein the first substrate bias-inhibiting high frequency switch unit consists of two NMOS (N-channel Metal Oxide Semiconductor) transistors and two PMOS (P-channel Metal Oxide Semiconductor) transistors, the second substrate bias-inhibiting high frequency switch unit consists of two NMOS transistors and two PMOS transistors and the transmission gate switch consists of one NMOS transistor and one PMOS transistor. In the high frequency switch circuit, because a feed through signal introduced by a switch parasitic capacitor can be grounded through a by-pass, the variation of the input end does not affect the output end after the switch is turned off, thereby the hold function of high precision is realized. The switch design of inhibiting the substrate bias effect is utilized. Because the variation of a threshold voltage caused by the inequality of a substrate and a source electric potential is inhibited, the linearity of the equivalent resistance of the switch circuit is better and the signal-to-noise distortion ratio of the circuit is improved.
Owner:ZHEJIANG UNIV

Novel Si-APD (Silicon-Avalanche Photo Diode) device

The invention discloses a novel Si-APD (Silicon-Avalanche Photo Diode) device. The novel Si-APD device comprises a first single Si-APD and a second single Si-APD which are arranged adjacently in parallel, wherein the first single Si-APD corresponds to a light window and serves as a light detection unit; the second single Si-APD is set in backlight and serves as a breakdown voltage detection unit; the first single Si-APD and the second single Si-APD share the same negative pole. Based on the principle that the properties of adjacent devices in the integrated circuit technology are consistent with each other, and paired Si-APDs are adopted; the first single Si-APD is used for detecting light and the second single Si-APD serves as the breakdown voltage detection unit; an optimal bias effect can be achieved, just by means of detecting the dark current of the second single Si-APD, stabilizing the value of the dark current via a negative feedback control loop, and utilizing the voltage when the value of the dark current is maintained at a set value to serve as the work bias voltage of the first single Si-APD, so that the complicacy problem of the traditional dynamic bias is solved, the complicacy degree and cost of a distance measuring system are lowered, and the novel Si-APD device is simple and practical.
Owner:ASSOC OPTO ELECTRONICS CHONGQING

Harmonic instability determination method for light-weight high-voltage direct-current power transmission 12-pulse wave converter

ActiveCN106208033ANegative sequence impedance parameter omittedReliable resultsDc circuit to reduce harmonics/ripplesModulation theoryTransformer
The invention discloses a harmonic instability determination method for a light-weight high-voltage direct-current power transmission 12-pulse wave converter. The harmonic instability determination method comprises the following steps of obtaining a relation of modulation from a direct current side current to an alternating current side, and a relation of modulation from an alternating current side voltage to the direct current side according to a 12-pulse wave converter switching function modulation theory; for low-order harmonics, setting a direct current side fundamental frequency harmonic current to be Idcl(t) at a t moment; modulating the direct current side harmonic current to the alternating current side through the converter as follows: a formula which is as shown in the specification; in a (t+<delta>t) moment, obtaining harmonic voltage change as follows: a formula which is as shown in the specification; obtaining harmonic instability engineering criterion of a single-circuit direct current line according to current ratio at the (t+<delta>t) moment and the t moment as follows: a formula which is as shown in the specification; and when a formula which is as shown in the specification is workable, showing that the current in the direct current side system is increased constantly, the system is instable, and the harmonic instability is excited. According to the harmonic instability determination method, by combination with a direct current magnetic bias effect of a transformer, a direct current magnetic bias coefficient is introduced; negative sequence impedance parameters at the alternating current side are omitted; the alternating current side positive sequence secondary impedance and the direct current side fundamental frequency impedance are adopted to determine whether the harmonic instability occurs or not, so that the determination method is more accurate and reliable.
Owner:SICHUAN UNIV

Transverse insulated gate bipolar transistor

InactiveCN107068744AThere is no negative resistance phenomenonImprove breakdown voltageTransistorSolid-state devicesPower flowCharge carrier
The invention belongs to the semiconductor power device technology field, and particularly relates to a transverse insulated gate bipolar transistor. In the invention, a poly-diode is formed on a surface of a drift region of a member and a PMOS and a Zener diode are formed in proximity to a collector; in a blocking state, under an action of charges and a field plate which are supplied through depleting the drift area in a reverse bias state of a polycrystalline diode on the surface of the member, voltage resistance higher than that that of a traditional structure is obtained while a doping concentration of the drift region of the member; in a process of switching off the member, a voltage change of a collector and a self-bias effect formed by a surface polycrystalline diode and a zener diode make PMOS near the collector automatically start and conduct and accelerate carrier extraction in an LIGBT so as to improve switching off speed of the member; in a conductive state, the PMOS around the collector is in a switching off state and an access of electronic current is cut off. As a result, the transverse insulated gate bipolar transistor has higher breakthrough voltage, and, in the process of switching off, has faster switching off speed and switching off loss.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

FINFET dynamic random access memory unit and processing method thereof

The invention provides a FINFET dynamic random access memory unit and a processing method thereof. The FINFET dynamic random access memory unit comprises a substrate, a body region, a source electrode, a drain electrode, a fin, a source electrode metal layer, a grid dielectric layer, a grid electrode and a passivation layer. The FINFET dynamic random access memory unit provided by the invention stores the produced carriers in the body region at the lower part a transistor, and based on the substrate bias effect of the transistor, by regulating the charges in the body region of the devices, the FINFET dynamic random access memory unit makes the threshold voltage of the devices vary so as to realize the aim of information storage. The FINFET dynamic random access memory unit is simple in principle, can obtain higher speed, cannot damage the charges stored in the body region during the data reading process, and improves the maximum refresh time; and the FINFET dynamic random access memory unit uses the FinFET structure, so that the reading and writing efficiency is improved. The processing method provided by the invention is simple in technology and compatible to the conventional CMOS (Complementary Metal Oxide Semiconductor) technology, and the dynamic random access memory unit formed by the method cannot damage the charges stored in the body region during the reading process and improves the maximum refresh time.
Owner:TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products