The invention relates to a temperature variable spectral 
measurement device, which comprises an excitation 
light source, an 
integrating sphere, a 
temperature control sample stage, a temperature controller and a 
detector. Specifically, the temperature controller is used for controlling the temperature of the 
temperature control sample stage, the excitation 
light source and the 
integrating sphere and the 
integrating sphere and the 
detector are all connected through 
optical fiber. The excitation light sent by the excitation 
light source is introduced into an integrating sphere entrance port of the integrating sphere through 
optical fiber and is incident to the 
temperature control sample stage, the light sent by a sample placed on the temperature 
control sample stage or the light reflected by the temperature 
control sample stage when no sample is placed thereon is collected by 
optical fiber through an integrating sphere exit port and is then introduced into the 
detector, by comparing the difference of emission spectra detected by the detector when a sample is placed and no sample is placed, the 
luminescence quantum yield can be calculated, thereby realizing measurement of sample 
luminescence. By combining the excitation light source and the detector, the temperature variable spectral 
measurement device provided by the invention can realize measurement of the temperature variable 
emission spectrum, 
quantum yield and other optical properties of a 
luminescent material.