The invention relates to a temperature variable spectral measurement device, which comprises an excitation light source, an integrating sphere, a temperature control sample stage, a temperature controller and a detector. Specifically, the temperature controller is used for controlling the temperature of the temperature control sample stage, the excitation light source and the integrating sphere and the integrating sphere and the detector are all connected through optical fiber. The excitation light sent by the excitation light source is introduced into an integrating sphere entrance port of the integrating sphere through optical fiber and is incident to the temperature control sample stage, the light sent by a sample placed on the temperature control sample stage or the light reflected by the temperature control sample stage when no sample is placed thereon is collected by optical fiber through an integrating sphere exit port and is then introduced into the detector, by comparing the difference of emission spectra detected by the detector when a sample is placed and no sample is placed, the luminescence quantum yield can be calculated, thereby realizing measurement of sample luminescence. By combining the excitation light source and the detector, the temperature variable spectral measurement device provided by the invention can realize measurement of the temperature variable emission spectrum, quantum yield and other optical properties of a luminescent material.