An apparatus for achieving in-situ micromechanics, microstructure and component integrated research in a scanning electron microscope belongs to the field of material microstructure and performance in-situ characterization. According to the apparatus, a double trapezoid leading screw transmission system is adopted, thus the apparatus is large in rigidity and high in test precision; the apparatus can stably operate in the scanning electron microscope, has low mechanical noise, and has low interference on scanning electron microscope imaging; the trapezoid leading screw has a self-locking function, thus the test can be paused and started at any time, continuity of test data is good; a sample clamp has a rotation function, thus when material extension/compression mechanical properties are measured, scanning electron beam imaging, EDS and EBSD integrated test can be satisfied at the same micro area; clamp support frames designed by the apparatus, the sample clamps and samples have the completely symmetrical structure, thus the samples receive the completely symmetrical extension/compression stress, and a geometric center of the sample, i.e., a deformation center, is located right under an electron beam all the time, thereby facilitating in-situ tracking dynamic research and high-quality microscopic scanning image acquisition.