15 results about "Optical Processes" patented technology

An information display device that displays image information as a virtual image on a projection surface, the device including: an opening portion at a part of the housing, image light generating means for generating image light, image light processing means for performing a predetermined optical process on the image light, and image projecting means for projecting the image light such that a viewer can recognize the image information as the virtual image in front of the projection surface, and an optical element in which a reflective polarizing plate is fixed to a substrate having a transmissive property with an adhesive agent or with a pressure-sensitive adhesive agent is provided in a part of an optical path inside the housing, as means for selectively reflecting a P-polarized light component of light in a visible light region, and a moisture-proof film is provided on a surface of the reflective polarizing plate.

The invention discloses a light field microscopic self-supervised denoising system and method fusing a physical process. The system comprises a light field imaging subsystem and a self-supervised denoising subsystem. The light field imaging subsystem is used for capturing multi-view light field original data of a sample; the self-supervised denoising subsystem is used for processing original data of a light field, preprocessing the original data of the light field in a training stage, and decomposing the original data into multi-view sub-images; the method comprises the following steps: constructing original data of a training set through two different self-supervision strategies, and then generating a self-supervision training data pair through RL deconvolution according to a physical optical process; and finally, a denoising model is obtained through 3D neural network training. In the reasoning stage, light field original data to be reconstructed are preprocessed and then subjected to RL deconvolution to generate input data to be denoised, the input data are input into the trained denoising model, and a reconstruction result is output. According to the invention, the problems of noise amplification, data dependence and poor universality of the light field fluorescence microscope are effectively overcome.

The invention discloses a focusing-free dual-wavelength laser beam expander and an anti-explosion laser range finder, the focusing-free dual-wavelength laser beam expander comprises a first lens group and a second lens group which are coaxially arranged at an interval, and the distance between the first lens group and the second lens group is fixed; the clear aperture of the second lens group is larger than that of the first lens group, dual-wavelength laser enters the first lens group and exits through the second lens group, so that the beam divergence angle of the dual-wavelength laser is achieved, the basically same multiplying power is compressed at the same time, and the dual-wavelength laser comprises first laser and second laser; the first laser and the second laser have different wavelengths, beam expansion of the dual-wavelength laser with basically the same magnification can be achieved at the same time, the divergence angle of the dual-wavelength laser beam is compressed with basically the same magnification at the same time, a focusing-free structure of a fixed lens structure is adopted, the requirement for the optical technology is low, the structure is simple, installation and adjustment are convenient, and damage is not likely to happen. The anti-riot laser range finder assembled by the anti-riot laser range finder is small in size, light in weight and beneficial to productization.

The present application belongs to the technical field of cigarette case detection, and particularly relates to an optical process detection device for cigarette packaging glue marks; the device comprises an image acquisition module black box, a light module and an image acquisition device are arranged on the top of the image acquisition module black box, the light module and the image acquisition device are connected with a cigarette case glue mark comparison processor, a main shaft is arranged in the image acquisition module black box, a base is arranged at the bottom of the main shaft, a rotatable cigarette case fixing module is arranged on the main shaft through a bearing, a fixing frame is arranged at the bottom of the rotatable cigarette case fixing module, a bearing is arranged between the fixing frame and the main shaft, a first gear is arranged on the side wall of the fixing frame, the first gear is in gear engagement with a second gear, the second gear is connected with a motor, and the motor is arranged on a fixing plate connected with the main shaft; the device can efficiently and processively solve the problem of identification and detection of tobacco packaging glue marks.

The invention discloses a femtosecond laser preparation method of a porous silicon-based integrated optical waveguide gas sensor, and belongs to the technical field of micro-nano optoelectronic devices and gas sensing. Comprising an oxidized porous silicon film; the three-dimensional waveguide structure is positioned in the oxidized porous silicon film and is formed by arranging positive refractive index densified track units; the fluorescent probe molecules are embedded into the waveguide; to-be-detected gas can interact with the fluorescent probe molecules so as to change the luminescence characteristic of the waveguide; two ends of the three-dimensional waveguide structure are respectively coupled with a section of optical fiber as a light input end and a light output end. A fluorescence probe and an optical waveguide are integrated in an oxidized porous silicon film through a femtosecond laser induced collapse densification technology, and a large-specific-surface-area nanopore structure and an evanescent field enhanced waveguide structure are utilized to realize full-optical-process high-sensitivity and ultrafast-response real-time optical detection of gas to be detected at normal temperature.

The invention provides a back heterogeneous integrated optical chip and a preparation method thereof. The chip comprises a slide glass, a silicon optical integration layer and an electro-optical crystal film bonded on the back surface. During preparation, a silicon light process is firstly completed on the front surface of the SOI, the original silicon substrate is overturned and removed after the slide glass is bonded, the electro-optical crystal is bonded on the exposed flat back silicon dioxide layer, and finally the electro-optical modulator waveguide and the metal link are processed. According to the invention, the problems of poor flatness and low bonding yield caused by a metal structure in traditional front bonding are effectively solved, and the flatness of the silicon light back surface is fully utilized to realize high-quality heterogeneous integration. The chip has the advantages of high integration level of silicon light and high bandwidth and low loss of the electro-optical crystal, and can be widely applied to a high-speed optical communication system with a single wave of more than 400G.

An apparatus for measuring a topography of a surface of an object comprises: an illumination system; an interference module; and a detection system. The illumination system is configured to emit primary radiation and project the primary radiation on the object so as to generate secondary radiation from a surface of the object via an even order non-linear optical process, the secondary radiation having a different wavelength to the primary radiation. The secondary radiation comprises a reflected portion and a transmitted portion. The interference module is operable to produce tertiary radiation having substantially the same wavelength as the secondary radiation, the tertiary radiation being incident on the object such that the tertiary radiation at least partially destructively interferes with the transmitted portion of the secondary radiation. The detection system is operable to receive the reflected portion of the secondary radiation and to determine a height of the substrate therefrom.

An optical surface analysis device (1) allows for the advantageous measurement, at the same location on a sample surface, of a nonlinear second harmonic generation (SHG) signal and a linear absorption signal in reflectivity, and their correlation to obtain information about the sample surface microstructure. The optical device was designed to integrate nonlinear reflectometry for SHG signal detection, visible reflection-absorption spectroscopy (Vis-RAS), and a visual control device for the sample surface using bright-field microscopy (CF), while maintaining the device's compact size. Abstract figure: Figure 1

An optical process lens of transparent ceramic is disclosed. The transparent ceramic may be used as part of an optical process lens assembly to replace glass with or without a metal frame or fused metal component.

The invention relates to a ghost image elimination method and device, electronic equipment, a storage medium and a program product, and the method comprises the steps: obtaining an original input image and a current eye point position, and the original input image comprises a main image and a background; determining a plurality of ghost image positions corresponding to the main image and the brightness color of each ghost image position according to the current eye point position, and determining a brightness compensation coefficient or a first compensation matrix of the original input image according to the brightness color of each ghost image position and the brightness colors of all positions of the background; and compensating the original input image according to the brightness compensation coefficient or the first compensation matrix to obtain a ghost image compensation graph of the original input image. Therefore, the problems that all ghost images cannot be completely eliminated and the process improvement process is tedious in the prior art are solved, the ghost images are eliminated in the mode that the background brightness and color are changed through the image algorithm under the condition that the optical design and the optical process are not changed, and therefore the display quality and the user experience are improved.

An information display device that displays image information as a virtual image on a projection surface, the device including: an opening portion at a part of the housing, image light generating means for generating image light, image light processing means for performing a predetermined optical process on the image light, and image projecting means for projecting the image light such that a viewer can recognize the image information as the virtual image in front of the projection surface, and an optical element in which a reflective polarizing plate is fixed to a substrate having a transmissive property with an adhesive agent or with a pressure-sensitive adhesive agent is provided in a part of an optical path inside the housing, as means for selectively reflecting a P-polarized light component of light in a visible light region, and a moisture-proof film is provided on a surface of the reflective polarizing plate.

The invention discloses a silicon optical chip structure and a manufacturing method. The silicon optical chip structure comprises a first dielectric layer and a second dielectric layer which are sequentially arranged on the surface of a substrate, a first device layer is arranged on the surface of the first dielectric layer, and a first passive device is arranged on the first device layer; a second device layer is arranged on the surface of the second dielectric layer, and a second passive device and an active device are arranged on the second device layer; the first device layer and the second device layer are isolated through a second dielectric layer; the first dielectric layer prevents light conducted to the first device layer and the second device layer from leaking into the substrate. According to the invention, the stability and reliability of the chip structure can be improved, light can be effectively prevented from leaking into the substrate, thermal crosstalk can be prevented, and integration of a silicon optical process and improvement of the performance of the silicon optical chip are facilitated.

A broadband radiation device, comprising an HC-PCF, the HC-PCF comprising: a hollow core extending along the length of the HC-PCF for confining, in use, a working medium at a pressure; an input operable to receive pulsed pump radiation; and an output, the output being operable to emit broadband output radiation resulting from a spectral broadening of the pulsed pump radiation within the working medium confined within the HC-PCF; wherein the HC-PCF is divided into a first section and a second section; wherein the first section comprises the input end and at least a portion of the first section comprises a curved portion and / or one or more coiled portions, and the second section comprises the output end and is substantially straight; and wherein, within the first section and the second section, the spectral broadening is dominated by a self-phase modulation process and a different non-linear optical process, respectively.

The invention relates to the technical field of optics, relates to an optical process technology, and particularly relates to a repairing structure of a nanometer grating reflecting layer and a repairing method of the repairing structure. The method comprises the following steps: firstly, providing a metal reflecting layer with a crack, arranging the metal reflecting layer on a grating structure layer, and dripping a nano-structure repairing adhesive into a crack area of the metal reflecting layer; the nanostructure repair adhesive is a fluid composition containing an organic repair adhesive and metal nanoparticles dispersed in the organic repair adhesive, and the material of the metal nanoparticles is the same as that of the metal reflecting layer. In the repairing process, through the capillary permeation effect and the pressure gradient generated by pressure reduction-back pressure circulation, the nanostructure repairing adhesive spontaneously permeates into the crack for filling, then the repairing adhesive is cured, the metal nanoparticles are fixed to the crack area, a protection layer is formed on the surface of the metal reflection layer, and the metal reflection layer is formed. Therefore, the integrity and stability of the reflecting layer are recovered.