The invention discloses a random excitation generation method,
system and device for a
chip verification test, and relates to the technical field of
chip verification, and the method comprises the steps: determining the priority of all variables in excitation according to the constraint condition of excitation needed by a to-be-tested
chip verification test case; whether inequality constraints exist in the constraint conditions or not is detected, if yes, the inequality constraints are equivalently replaced with a unified representation form, then subsequent steps are executed, and if not, the subsequent steps are directly executed; on the basis of the priorities of the variables, intersection of all the related constraints of each variable in the constraint conditions is solved, all the related constraints of each variable are converted into a
range constraint, and thus an optimized constraint condition is generated; and on the basis of the optimized constraint conditions, according to the priorities of the variables, the random excitation required by the verification
test case of the to-be-tested chip is obtained through successive stochastic operation from high to low.