The application provides a wire SI performance
test board for rapid docking, comprising a test mainboard, a plurality of test output interfaces are arranged on the front surface of the test mainboard, a first SMA interface is arranged on the upper side of the test output interface, a second SMA interface is arranged on the left side of the test output interface, a
test input interface is arranged on the back surface of the test mainboard, the
test input interface is provided with a first magnetic attraction
assembly, the test mainboard further comprises a
test input connector, the test input connector is provided with a second magnetic attraction
assembly, one end of the test input connector is rapidly docked with the test input interface through the second magnetic attraction
assembly and the first magnetic attraction assembly, and the other end of the test input connector is provided with a wire docking interface. The application can significantly improve the wire connection / detaching efficiency, is simple and reliable to operate, reduces interface abrasion, and has good adaptability.