The invention relates to a method for tunably capturing and screening
topological insulator particles above a substrate through utilizing linearly polarized planar light
waves. According to the method, the
topological insulator particles are arranged above the flat substrate plate; the symmetrical distribution of Poynting vectors around the
topological insulator particles is destroyed, so that the total
Poynting vector on the topological insulator particles is not zero, and therefore, a non-gradient
optical force can be generated; the
quantum state of a topological insulator is changed, so that the direction and magnitude of the total
Poynting vector on the topological insulator particles can be changed, and therefore, the direction and magnitude of the non-gradient
optical force which is acted on the topological insulator particles by the total
Poynting vector can be changed, and as a result, the movement tracks of the topological insulator particles in an incident
light field can be adjusted and controlled, and tunable capture and screening of nanoscale molecules attached to the surfaces of the topological insulator particles can be realized; and reversible
quantum phase transition of the topological insulator from topological non-trivialness to topological trivialness can be realized through
modes such as illumination,
electrification, heating and pressurization.