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34results about How to "Eliminate sharp corners" patented technology

Anti-dazzle processing method for electronic product glass display screen

The invention provides an anti-dazzle processing method for an electronic product glass display screen and belongs to the technical field of display screen processing technology. The anti-dazzle processing method includes rinsing and dedusting the glass display screen in a rinsing tank and subjecting the rinsed and dedusted glass display screen to ultrasonic cleaning in an ultrasonic cleaner; sticking corrosion-resistant plastic protective films on four side faces and the back face of the glass display screen; heating frosting liquid to 20-26 DEG C, and soaking the glass display screen in the heated frosting liquid for 60-120 seconds; removing the protective films on the glass display screen; filling a jetting machine with a polishing solution, fixing the glass display screen, and jetting the polishing solution to the front face of the glass display screen through a spray head of the jetting machine for 180-300 seconds. The anti-dazzle processing method for the electronic product glass display screen has the advantages that the anti-dazzle processing method solves the technical problems of poor surface quality, bad hand feeling, weak anti-dazzle capability and the like of anti-dazzle glass manufactured by an existing anti-dazzle processing method for the display screen; microcosmic sharp corners are eliminated by means of adopting a unique high-pressure jetting and polishing mode, so that anti-dazzle capability is improved.
Owner:ZHEJIANG XINGXING TECH CO LTD

Trapezoidal wave zone plate with quasi-single-stage focusing characteristic

InactiveCN105866870ASelf-supportingDoes not affect diffraction resultsDiffraction gratingsIsosceles trapezoidSingle stage
The invention discloses a trapezoidal wave zone plate with a quasi-single-stage focusing characteristic. The trapezoidal wave zone plate comprises a light-proof substrate and a plurality of ring-shaped wave zones which are sequentially arranged from inside to outside by taking the substrate as a center, wherein each ring-shaped wave zone comprises at least two spiral trapezoidal hole light transmission units which are formed by twisting isosceles-trapezoid-shaped hole light transmission units, and are sequentially connected; the radial light transmittance of the wave zone plate meets a formula shown in the description. Compared with a common Fresnel wave zone plate, the trapezoidal wave zone plate can restrain the diffraction efficiency of a senior focus very well, also can reduce the peak strength of the senior focus. Moreover, when a ratio of the top edge of the original trapezoid to the bottom edge of the original trapezoid is equal to 1 to 5, the trapezoidal wave zone plate further has the effect of eliminating a 3n-level focus, and also restrains the efficiency of a 5-level focus to 0.16% of a 1-level focus (insulating efficiency being 6.93%). Compared with a Gabor wave zone plate, the 1-level focus efficiency is higher than the focusing efficiency of the Gabor wave zone plate, and the trapezoidal wave zone plate is easier to manufacture in comparison with a plurality of binaryzation Gabor wave zone plates.
Owner:LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS

Floating gate structure and manufacturing method thereof

The invention discloses a floating gate structure and a manufacturing method thereof. The method comprises the steps of providing a substrate which comprises a first part and a second part, performing well injection on the substrate, continuously forming a gate oxide layer, then forming a plurality of first polycrystalline silicon structures, forming shallow grooves in the substrate between the adjacent first polycrystalline silicon structures, forming shallow groove isolation, depositing a second polycrystalline silicon layer on the first polycrystalline silicon structures and the shallow groove isolation on the first part, etching the second polycrystalline silicon layer, forming second polycrystalline silicon structures, exposing partial shallow groove isolation, and allowing side walls of the second polycrystalline silicon structures on the two sides of the exposed partial shallow groove isolation to be smooth. The method saves a photomask, simplifies a technology, and achieves perfect alignment of floating gate polycrystalline silicon and an active region. An application of a floating gate polycrystalline silicon side wall technique meets a control gate and floating gate coupling requirement, eliminates a sharp corner, and facilitates storing charge in floating gate polycrystalline silicon.
Owner:WUHAN XINXIN SEMICON MFG CO LTD

Method for eliminating sharp corner at top end of groove

ActiveCN103137483ASpeed up etchingEliminate sharp cornersSemiconductor/solid-state device manufacturingHelix-destabilizing proteinsCompound (substance)
The invention discloses a method for eliminating a shaft corner at the top end of a groove. The method comprises the steps of 1, enabling oxide-nitride-oxide (ONO) to grow, 2, enabling the ONO to be etched, 3, enabling the groove to be etched, wherein the ONO serves as hard mask for dry etching, 4, enabling middle silicon nitride of the hard mask to be etched by a transverse wet method, wherein the sharp corner at the top end of the groove is required to be exposed completely, 5, enabling top layer oxidation film remained on the hard mask to be etched in a complete mode, and meanwhile enabling bottom oxidation film of the hard mask to be etched in transverse mode, 6, conducting homodromous etching at the bottom of the groove, and meanwhile conducting transverse etching and vertical etching for the sharp corner at the top end of the groove so as to reduce the sharp corner at the top end, 7, enabling a sacrificed oxide layer to grow inside the groove, enabling the sharp corner at the top end of the groove to be completely oxidized and to be disappeared, 8, enabling the sacrificed oxide layer to be etched in the wet method, enabling the silicon nitride to be etched in the wet manner, and keeping part of the silicon nitride serving as a barrier layer for helix destabilizing protein (HDP) chemical mechanical lapping. According to the method for eliminating the shaft corner at the top end of the groove, the sharp corner at the top end of the groove can be eliminated, and the fact that trailing HDP can fill the groove without holes is guaranteed.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

Method for producing stainless steel slab by radian chamfer crystallizer continuous casting machine

InactiveCN111286576AExtended soft blowProlonged sedationCrazingContinuous caster
The invention discloses a method for producing a stainless steel slab by a radian chamfer crystallizer continuous casting machine. The method comprises the steps of molten iron dephosphorization, TSRfurnace smelting, LF refining and continuous casting; and according to the continuous casting process, the radius R of a chamfer arc of a crystallizer is 80-82 degrees, the diameter width of the chamfer arc is 39-40 mm, the flow rate of cooling water in a copper plate water tank of the chamfer crystallizer is 7.9-8.2 m/min, the water quantity of the narrow surface of the chamfer crystallizer is 450-550 L/min, and the water quantity of the wide surface is 3800-4200 L/min. Compared with the prior art, the method adopts molten iron pre-dephosphorization and TSR furnace desulfurization process, the soft blowing and calming time is prolonged by an LF furnace, low oxygen, low phosphorus and low sulfur are realized, and inclusions are controlled; cooling parameters of the crystallizer and a fan-shaped section are designed to adopt a conventional pressing mode and electromagnetic stirring so as to slow down the corner cooling strength of a casting blank and eliminate corner cracks and sharp corners; the edge loss phenomenon of a hemmed part of hot rolled steel is avoided; and therefore, the depth and the width of a slit line of a steel coil product are reduced, the product quality is improved, and the economic benefits are greatly improved.
Owner:SHANDONG TAISHAN STEEL GROUP

Chopper structure

The invention relates to a chopper structure which comprises a chopper body. The copper body is internally provided with a conical wall of which the central axis is superposed with that of the chopper body, wherein the conical wall is next to the end of the copper body, an inner chamber wall which is coaxially arranged with the conical wall, and a first arc-shaped transition wall which is connected with the conical wall and the inner chamber wall. The conical wall, the inner chamber wall and the first arc-shaped transition wall form a wire passing through hole for passing of a solder wire. In a movement process of the solder wire relative to the wire passing through hole, because the first arc-shaped transition wall is connected between the conical wall and the inner chamber wall, a closed angle at a connection part between the conical wall and the inner chamber wall is eliminated, and smooth transition of the connection between the conical wall and the inner chamber wall is realized, thereby effectively preventing scratch of the closed angle to the surface of the solder wire, ensuring high mechanical strength of the solder wire, realizing no easy pulling breakage or fatigue breakage of the solder wire by an external impact force or an alternate stress, and ensuring high soldering quality of the solder wire.
Owner:CHAOZHOU THREE CIRCLE GRP

Process integration method for improving flash memory unit

The invention provides a process integration method for improving a flash memory unit. The method comprises steps that a substrate structure is formed through device ion implantation; a flash memory oxide layer, a floating gate polysilicon layer and a silicon nitride layer are sequentially deposited; a shallow trench isolation structure is formed, and a silicon oxide layer is deposited on the shallow trench isolation structure; pre-cleaning processing is carried out, the silicon nitride layer and the silicon oxide layer of the shallow trench isolation structure are partially removed through etching to expose a floating gate polysilicon tip; the exposed floating gate polysilicon tip is oxidized to round the tip; etching processing is carried out, the silicon oxide layer of the shallow trench isolation structure is partially removed, and the silicon oxide for rounding the floating gate polysilicon tip is further removed; the silicon nitride layer is removed through etching till the floating gate polysilicon layer is exposed. The method is advantaged in that arcing of the floating gate tip is realized in advance through the added silicon oxide, arcing of the floating gate tip and thenon-damaged flash memory unit at the top portion of the floating gate are realized, and another optimization method is provided for continuously reducing the flash memory unit.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Triple screw for correcting tooth profiles through arcs

The invention discloses a triple screw for correcting tooth profiles through arcs. The triple screw comprises two double-end driven screw bodies and a double-end driving screw body. The driving screw body is located in the middle, and the driven screw bodies are symmetrically arranged along the circumference of the driving screw body. Each tooth profile of each driven screw body is composed of the transition arc, a long-amplitude epicycloid, a tooth root circle and a tooth crest circle. Each tooth profile of the driving screw body is composed of an arc envelope line, a tooth crest circle and a tooth root circle. The design range of the radius of the transition arc in each tooth profile of each driven screw body is ro/dj, and the value ranges from 0.015 to 0.025. According to the triple screw for correcting the tooth profiles through the arcs, smoothness is achieved in the engagement process, wear resistance of the driven screw bodies is remarkably improved, the work life of a screw pair is prolonged by about 30% to 40%, and the stable volume efficiency is kept. In addition, when a disc milling cutter or a grinding wheel machines the driving screw body, the service life of the cutter is prolonged by about 50%, and the machining difficulty is reduced.
Owner:黄山工业泵制造有限公司

Shaping equipment for construction waste resource utilization recycled aggregate particles

The invention discloses shaping equipment for construction waste resource utilization recycled aggregate particles. The shaping equipment comprises a feeding hopper and a discharging hopper, and a plurality of particle shaping equipment are sequentially installed in an equipment rack from top to bottom. Each particle shaping equipment is composed of a crushing device and a grinding device, whereinthe crushing device comprises a rotatable cone sleeve crushing device, the cone sleeve crushing device is composed of a cone sleeve and a grinding sleeve, and the grinding device comprises a roller rotatably mounted on a lower cover plate inside the equipment rack. According to the equipment, substances such as flat aggregate and cement attached to the surface of the aggregate can be eliminated,and sharp corners on the surface of the aggregate can be eliminated; and the upper and lower groups of particle shaping equipment are arranged, so that the aggregate is fully beaten, abraded and impacted, and the quality effect of aggregate treatment is guaranteed. Each crushing device is provided with a plurality of tooth shafts which rotate alternately to impact the aggregate to eliminate the flat aggregate, each cone sleeve and each roller rotate reversely at a high speed, and crushing and shaping are realized through multiple collision friction.
Owner:高淑兰

Method for rounding top corner of groove and semiconductor structure

The invention provides a method for rounding a top corner of a groove and a semiconductor structure. According to the method, the top corner of the groove is made to be always in an exposed state in a groove forming process through the back etching of a first mask layer next to a substrate, and the top sharp corner of the groove can be synchronously rounded in a groove etching process, so that the smooth and round top corner of the groove can be formed. With the method adopted, a sharp corner at the top of the groove is eliminated, the smooth and round top corner of the groove can be formed while the groove is etched, no independent rounding operation needs to be added, the whole method is simple in process, and the production cost is greatly reduced; and the first mask layer is subjected to back etching by adopting wet etching, so that the whole etching process is easier to control, the back etching amount can be more accurately controlled, and the subsequent rounding of the top corner of the groove is simpler and easier to control. According to the semiconductor structure with the groove top corner formed by the method, the electric leakage phenomenon can be effectively avoided, the breakdown voltage can be improved, and the reliability of the semiconductor structure can be ensured.
Owner:SIEN QINGDAO INTEGRATED CIRCUITS CO LTD

Anti-glare processing method for glass display screen of electronic product

The invention provides an anti-glare processing method for a glass display screen of an electronic product, belonging to the technical field of display screen processing technology. It solves the technical problems of poor surface quality, bad hand feeling and weak anti-glare ability of the anti-glare glass manufactured by the anti-glare processing method of the existing display screen. In this anti-glare processing method, the glass display screen is put into a cleaning tank for cleaning and dust removal, and then put into an ultrasonic cleaning machine for ultrasonic cleaning; a corrosion-resistant plastic protective film is pasted on the four sides and the back of the glass display screen; Heat the frosting liquid to 20°C-26°C, put the glass display in the frosting liquid and soak for 60-120 seconds; remove the protective film on the glass display; put the polishing liquid into the jet machine, and put the glass display The screen is fixed, and the polishing liquid is sprayed to the front of the glass display screen through the nozzle of the jetting machine, and the spraying time is 180-300 seconds. The invention adopts a unique high-pressure jet polishing method to eliminate these microscopic sharp corners and improve the anti-glare ability.
Owner:ZHEJIANG XINGXING TECH CO LTD

A process integration method for improving flash memory cells

The invention proposes a method for improving the process integration of flash memory cells, including: device ion implantation to form a substrate structure; sequentially depositing a flash memory oxide layer, a floating gate polysilicon layer and a silicon nitride layer; forming a shallow trench isolation structure and depositing an oxide layer therein. Silicon layer: perform pre-cleaning treatment, etch to remove part of the silicon nitride layer and part of the silicon oxide layer in the shallow trench isolation structure, exposing the floating gate polysilicon sharp corner; oxidize the exposed floating gate polysilicon sharp corner to make the sharp corner smooth Carry out etching treatment to remove part of the silicon oxide layer in the shallow trench isolation structure, and simultaneously remove the silicon oxide used for rounding the corners of the floating gate polysilicon; etch and remove the silicon nitride layer until the floating gate polysilicon is exposed layer. The present invention utilizes the increased silicon oxide to advance the rounding of the sharp corners of the floating gates, and at the same time realizes the rounding of the sharp corners of the floating gates and the undamaged flash memory cells on the top of the floating gates of the flash memory cells, so as to provide continuous shrinkage of flash memory Cells provide another way to optimize.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

a polarization rotator

Disclosed is a polarization rotator (20), comprising a first stage waveguide (21) and a second stage waveguide (22). The second stage waveguide (22) and the first stage waveguide (21) are in cascade connection. The first stage waveguide (21) has the same thickness as the second stage waveguide (22). The first stage waveguide (21) comprises a first stage upper layer waveguide (211) and a first stage lower layer waveguide (212). In a direction from the first stage waveguide (21) to the second stage waveguide (22), the width of the first stage upper layer waveguide (211) gradually narrows from a first preset width (W) to a second preset width (W-We), while the first stage lower layer waveguide (212) keeps a consistent width. The second stage waveguide (22) comprises a second stage upper layer waveguide (221) and a second stage lower layer waveguide (222). The thickness of the second stage upper layer waveguide (221) is the same as that of the first stage upper layer waveguide (211), and in a direction from the first stage waveguide (21) to the second stage waveguide (22), the width of the second stage lower layer waveguide (221) gradually narrows from a first preset width (W) to a second preset width (W-We), while the second stage upper layer waveguide (221) keeps a consistent width. The structure of the polarization rotator (20) can be easily manufactured and implemented.
Owner:HUAWEI TECH CO LTD

Trapezoidal zone plate with quasi-single-stage focusing

InactiveCN105866870BSelf-supportingDoes not affect diffraction resultsDiffraction gratingsIsosceles trapezoidSingle stage
The invention discloses a trapezoidal wave zone plate with a quasi-single-stage focusing characteristic. The trapezoidal wave zone plate comprises a light-proof substrate and a plurality of ring-shaped wave zones which are sequentially arranged from inside to outside by taking the substrate as a center, wherein each ring-shaped wave zone comprises at least two spiral trapezoidal hole light transmission units which are formed by twisting isosceles-trapezoid-shaped hole light transmission units, and are sequentially connected; the radial light transmittance of the wave zone plate meets a formula shown in the description. Compared with a common Fresnel wave zone plate, the trapezoidal wave zone plate can restrain the diffraction efficiency of a senior focus very well, also can reduce the peak strength of the senior focus. Moreover, when a ratio of the top edge of the original trapezoid to the bottom edge of the original trapezoid is equal to 1 to 5, the trapezoidal wave zone plate further has the effect of eliminating a 3n-level focus, and also restrains the efficiency of a 5-level focus to 0.16% of a 1-level focus (insulating efficiency being 6.93%). Compared with a Gabor wave zone plate, the 1-level focus efficiency is higher than the focusing efficiency of the Gabor wave zone plate, and the trapezoidal wave zone plate is easier to manufacture in comparison with a plurality of binaryzation Gabor wave zone plates.
Owner:LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS

Manufacturing method of high-voltage thick gate oxide

The invention discloses a manufacturing method of a high-voltage thick gate oxide, and the method comprises the following steps of: depositing cushion silicon oxide on a silicon substrate, and depositing cushion silicon nitride on the cushion silicon oxide; carrying out shallow trench isolation photoetching, etching, silicon oxide filling and chemical mechanical grinding; sequentially depositing mask silicon nitride and mask silicon oxide on a silicon wafer; removing the mask silicon oxide and the mask silicon nitride in ae high-voltage thick gate oxide region through photoetching and etching processes, and reserving the cushion silicon nitride between the two shallow trench isolations in the high-voltage thick gate oxide region; carrying out first thermal oxidation growth to passivate the shallow trench isolation corner of the high-voltage gate oxide region; removing the cushion silicon nitride between the two shallow trench isolations of the high-voltage thick gate oxide region; and carrying out second thermal oxidation growth to generate the high-voltage thick gate oxide. The thick gate oxide and the STI corner gate oxide of the high-voltage device manufactured by the manufacturing method of the high-voltage thick gate oxide are thickened, passivated and smooth, the STI sharp corner problem can be eliminated, the reliability of the high-voltage thick gate oxide and the performance of the high-voltage device are improved, the process is simple, and the cost is low.
Owner:HUA HONG SEMICON WUXI LTD

A Method for Eliminating Sharp Angles at the Top of Groove

ActiveCN103137483BSpeed up etchingEliminate sharp cornersSemiconductor/solid-state device manufacturingHelix-destabilizing proteinsCompound (substance)
The invention discloses a method for eliminating a shaft corner at the top end of a groove. The method comprises the steps of 1, enabling oxide-nitride-oxide (ONO) to grow, 2, enabling the ONO to be etched, 3, enabling the groove to be etched, wherein the ONO serves as hard mask for dry etching, 4, enabling middle silicon nitride of the hard mask to be etched by a transverse wet method, wherein the sharp corner at the top end of the groove is required to be exposed completely, 5, enabling top layer oxidation film remained on the hard mask to be etched in a complete mode, and meanwhile enabling bottom oxidation film of the hard mask to be etched in transverse mode, 6, conducting homodromous etching at the bottom of the groove, and meanwhile conducting transverse etching and vertical etching for the sharp corner at the top end of the groove so as to reduce the sharp corner at the top end, 7, enabling a sacrificed oxide layer to grow inside the groove, enabling the sharp corner at the top end of the groove to be completely oxidized and to be disappeared, 8, enabling the sacrificed oxide layer to be etched in the wet method, enabling the silicon nitride to be etched in the wet manner, and keeping part of the silicon nitride serving as a barrier layer for helix destabilizing protein (HDP) chemical mechanical lapping. According to the method for eliminating the shaft corner at the top end of the groove, the sharp corner at the top end of the groove can be eliminated, and the fact that trailing HDP can fill the groove without holes is guaranteed.
Owner:SHANGHAI HUAHONG GRACE SEMICON MFG CORP

A three-screw screw with circular arc correction tooth shape

The invention discloses a triple screw for correcting tooth profiles through arcs. The triple screw comprises two double-end driven screw bodies and a double-end driving screw body. The driving screw body is located in the middle, and the driven screw bodies are symmetrically arranged along the circumference of the driving screw body. Each tooth profile of each driven screw body is composed of the transition arc, a long-amplitude epicycloid, a tooth root circle and a tooth crest circle. Each tooth profile of the driving screw body is composed of an arc envelope line, a tooth crest circle and a tooth root circle. The design range of the radius of the transition arc in each tooth profile of each driven screw body is ro / dj, and the value ranges from 0.015 to 0.025. According to the triple screw for correcting the tooth profiles through the arcs, smoothness is achieved in the engagement process, wear resistance of the driven screw bodies is remarkably improved, the work life of a screw pair is prolonged by about 30% to 40%, and the stable volume efficiency is kept. In addition, when a disc milling cutter or a grinding wheel machines the driving screw body, the service life of the cutter is prolonged by about 50%, and the machining difficulty is reduced.
Owner:黄山工业泵制造有限公司
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