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141results about How to "Suppress stray light" patented technology

Astigmatic compensation type interference detecting device and method for optic free curved surfaces

The invention discloses an astigmatic compensation type interference detecting device and method for optic free curved surfaces. The device comprises He-He lasers, a beam expander, a 1 / 2 wave plate, a polarized beam splitter, a first 1 / 4 wave plate, a second 1 / 4 wave plate, a standard plane reflector, a phase shifter, a first convergent lens, a to-be-tested free curved surface, a second convergent lens, a plane reflector, a polarizer, a rotating frosted glass screen, an imaging objective lens, a detector, a displayer and a computer. The method comprises the steps of placing the to-be-tested free curved surface in an inclined state to make test beams come in a specific angle in an inclined mode to compensate for main surface shape astigmatic error components of the to-be-tested free curved surface, therefore reducing the degree of divergence of the subsequent test beams, and making the stripes discernable on the detector. The detector collects a series of phase-shifting interferograms which are treated with a wave front reconstruction algorithm to obtain a surface shape of the to-be-tested free curved surface. According to the astigmatic compensation type interference detecting device and method for optic free curved surfaces, the astigmatic compensation method is used for testing optic free curved surfaces for which the main surface shape error components are astigmatism, the stability is high, and the cost is low.
Owner:NANJING UNIV OF SCI & TECH

Digital holographic detection device for subsurface defect of optical element

The invention relates to a digital holographic detection device for a subsurface defect of an optical element. A light beam in the device is divided into a measuring light beam and a reference light beam, so that a measuring light path is obliquely incident to an object to be measured and symmetrically receives reflected light, the reflected light interferes with reference light, scattered light information of the subsurface defect is acquired from an interference pattern, the direct reflected light on the surface and stray light in a system are inhibited, and the scattered light information of the subsurface defect of the optical element is acquired. The detection device has the characteristics that: (1) a light source is a short coherent light source, so that the stray light in the system can be inhibited; (2) the measuring light path in the device is obliquely incident and symmetrically receives the reflected light, so that the direct reflected light on the surface of the optical element can be inhibited, only scattered light from the subsurface defect is received, and the signal-to-noise ratio of a signal is improved; (3) an optical fiber probe in the device is used for receiving the scattered light information, so that the limitation that a high-rate microscope objective is used for receiving the subsurface defect is overcome; and (4) the acquired image is analyzed and processed according to a digital holographic calculation principle, so that the quantitative depth information of the subsurface defect is acquired.
Owner:SHANGHAI UNIV

Constant resolution multi-spectral optical system applicable to large dynamic range and nearly-hemispherical view field

The invention provides a constant resolution multi-spectral optical system applicable to a large dynamic range and a nearly-hemispherical view field.The optical system sequentially comprises a homocentric sphere lens, multiple apertures and multiple imaging micro lenses which are in one-to-one correspondence with the apertures in the light incidence direction, and the apertures and the corresponding imaging micro lenses are distributed on the light-out position of the homocentric sphere lens in a fan-shaped mode and located on two different homocentric spherical surfaces of the homocentric sphere lens; each imaging micro lens and the corresponding aperture form a separate imaging channel; the imaging micro lenses comprise multiple short-focus correction lenses, multiple middle-focus correction lenses and multiple long-focus correction lenses, and correction lens sets with different focal lengths are adopted by the imaging micro lenses to correct aberrations in different view fields, so that the constant high resolution is guaranteed.According to the constant resolution multi-spectral optical system, interference of a local intense light source to all the view fields is avoided, and imaging detection within the large dynamic range can be achieved.
Owner:XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI

Full parameter detection apparatus of polished surface quality of optical element and detection method thereof

The invention relates to a full parameter detection apparatus of a polished surface quality of an optical element and a detection method thereof. According to an existing polished surface quality parameter detection method and an apparatus thereof, a surface quality of an evaluated region can not be reflected really. According a technical scheme employed in the invention, a full parameter detection apparatus of a polished surface quality of an optical element is provided; the apparatus comprises a light source excitation system, a white light interference system, a laser confocal detection system, a computer, a CCD camera, a pinhole photoelectric detector and signal processing unit, a diaphragm photoelectric detector and signal processing unit and a three dimensional scanning and control unit; the light source excitation system is formed by a laser excitation system and a broadband light source excitation system, wherein optical paths of the laser excitation system and the broadband light source excitation system are vertical; and the CCD camera, the pinhole photoelectric detector and signal processing unit, the diaphragm photoelectric detector and signal processing unit and the three dimensional scanning and control unit are respectively connected with the computer. Moreover, the white light interference system is arranged between the broadband light source excitation system and the CCD camera; and the laser confocal detection system is arranged between the laser excitation system and the pinhole photoelectric detector and signal processing unit and the diaphragm photoelectric detector and signal processing unit. According to the invention, a surface quality of an evaluated region can be reflected effectively and really.
Owner:XIAN TECH UNIV

Radar/infrared two-waveband frequency selective surface

ActiveCN103487860AHigh optical transmittanceUniform distribution of diffracted light intensityDiffraction gratingsWaveguide type devicesWire widthRadar
The invention discloses a radar/infrared two-waveband frequency selective surface which solves the technical problems that a latticed metal mesh FSS in the prior art cannot further improve optical transmittance, the distribution of stray light is centralized, and the application in high-precision detection and imaging observation is not facilitated, and belongs to the technical field of electromagnetic shielding. The radar/infrared two-waveband FSS is a cross-hole-shaped periodic array on a metal mesh, the metal mesh is a round-hole-shaped metal mesh or a hexagonal metal mesh, the periods of cross hole shapes are the integer multiples of the period of the metal mesh, and each cross hole shape meets the two following constraint conditions that the slit width of the cross hole shapes is the integer multiples of the period of the metal mesh minus the wire width of the metal mesh; the difference between the slit length of the cross hole shapes and the slit width of the cross hole shapes is the even times of the period of the metal mesh. The radar/infrared two-waveband FSS is higher in optical transmittance, more even in diffraction light distribution and capable of effectively restraining the stray light.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Measuring device and measuring method for tiny surface defect through post-magnification digital holographic microscopy

The invention relates to a measuring device and a measuring method for a tiny surface defect through post-magnification digital holographic microscopy. The measuring method comprises the steps that a short coherent light source is adopted; scattered light information of the tiny surface defect of an optical element is obtained in an oblique incidence manner; scattered light interferes with a reference beam; interference image information is magnified in a post-magnification manner and received by a CCD (Charge Coupled Device) camera; and finally a pattern of the tiny surface defect and quantification information of depth distribution are computed and analyzed through a digital holographic principle. The device is mainly used for achieving detection of the tiny surface defect of the smooth optical element. The device can obtain depth and phase information of the surface defect by acquiring a single image and conducting related processing, can distinguish surface dust and indentation of the optical element, and can dynamically and rapidly measure. The device adopts a parallel light irradiation and off-axis holographic technique, and forms a post-magnification digital holographic recording system, so that the device is good in dynamic property and has the characteristics of non-destruction and information quantification.
Owner:SHANGHAI UNIV

High-resolution micro broad-spectrum reflective optical system for spectrograph

The invention discloses a high-resolution micro broad-spectrum reflective optical system for a spectrograph, which relates to the field of optical analytical instruments and solves the problems of low spectral resolution capacity, low optical energy transfer efficiency and complex instrument processing, installation and debugging of the instrument having the conventional optical system. The system of the invention comprises an optical fiber interface, a slit, a collimator objective, an imaging objective, a detector image surface, a planar reflection grating and a rotating platform, wherein the planar reflection grating is arranged on the rotating platform, a sample light source is coupled to the optical fiber interface and projected into the collimator objective from the slit; the parallel light beam emitted by the light source and transmitted out from the collimator objective is projected to the planar reflection grating and reflected to the imaging objective; the light beam transmitted out from the imaging objective is imaged onto the detector image surface to form an image signal, and the spectral absorption components of the sample light source can be analyzed; and the collimator objective and the imaging objective are spherical reflector. The system can be widely used in portable spectrograph for field geological and hydrologic survey and military reconnaissance.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Lobster eye lens for restricting generation of stray light by adopting light-absorbing coating

The invention relates to a lobster eye lens for restricting the generation of stray light by adopting a light-absorbing coating, belonging to the technical field of bionic optics. In the prior art, stray light is reflected to cause fuzzy images. The lobster eye lens comprises a plurality of micro-channel tubes in the shape of a regular square pyramid with a cone-apex angle alpha, inner walls of four isosceles trapezoidal sides of the regular square pyramid are used as reflecting walls, the outer margins of the micro-channel tubes are formed by four edges at the bottom surface of the regular square pyramid, the outer margin of each micro-channel tube is arranged on a sphere with a radius r1, the inner margins of the micro-channel tubes are formed by four edges at the top surface of the regular square pyramid, the inner margin of each micro-channel tube is arranged on sphere with a radius r2, the reflecting wall of each micro-channel tube is coated with an outer margin light-absorbing coating ring belt with a width s1 inwards from the outer margin, the reflecting wall of each micro-channel tube is coated with an inner margin light-absorbing coating ring belt with a width s2 inwards from the inner margin, and an included angel beta is formed between marginal rays of incident micro-channel tube parallel light e close to one side of an incident light optic axis and the reflecting walls below the micro-channel tubes.
Owner:CHANGCHUN UNIV OF SCI & TECH

Ultra-wide field-of-view off-axis three-reflector optical imaging system

The invention discloses an ultra-wide field-of-view off-axis three-reflector optical imaging system which comprises a main reflector with positive focal power, a second reflector with negative focal power, and a third reflector with positive focal power. The reflecting surface of the main reflector is a spherical surface. The reflecting surfaces of the secondary mirror and the third reflector are flat spherical secondary curved surfaces. The curvature radii of top points of the three reflectors approximately satisfy a flat image field condition. The main reflector generates a real image of a far scene between the main reflector and the second reflector. The second reflector and the third reflector perform relay imaging of the real image on an image plane. An aperture diaphragm is placed on the front focal plane of the third reflector, thereby realizing an image-side telecentric optical path. The main reflector inclines along an X-axis relative to incident main light of a central field-of-view. The second reflector is coaxial with the third reflector. After the main light of the central field-of-view in a meridian plane is reflected by the main reflector, an included angle is formed between the reflected main light and the common symmetric axis of the second reflector and the third reflector. The ultra-wide field-of-view off-axis three-reflector optical imaging system has advantages of ultra-wide field-of-view, intermediate relative aperture, wide working wave band, no image-side telecentric barrier, small object-side distortion, high imaging quality, etc. The ultra-wide field-of-view off-axis three-reflector optical imaging system is suitable for earth imaging observation field of a spatial camera, an imaging spectrometer, etc.
Owner:SUZHOU UNIV
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