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51results about How to "Improve uneven thickness" patented technology

Crystallizer covering slag for continuously casting high-manganese high-aluminum steel and preparation method of crystallizer covering slag

The invention provides a crystallizer covering slag for continuously casting high-manganese high-aluminum steel and preparation method of the crystallizer covering slag. The covering slag is prepared from the following components in parts by weight: 20-38 parts of CaO, 20-35 parts of Al2O3, 5-18 parts of SiO2, 10-22 parts of BaO, 2-7 parts of Li2O, 5-12 parts of F<->, 1-4 parts of MgO, 2-8 parts of C and Fe2O3 which is less than or equal to 2 parts. According to the preparation method disclosed by the invention, wollastonite, limestone, quartz sand, fluorite, bauxite, barium carbonate, magnesia, soda, lithium carbonate and carbonaceous materials are used as raw materials, and the covering slag is prepared through the following steps of: calculating of consumption, melting, smashing, fine grinding, drying and granulation. The covering slag disclosed by the invention has the characteristics of being low in reactivity and good in property stability, the lubrication and the thermal transmission of casting blanks can be effectively coordinated and controlled, the smooth performing of the continuous casting process of the high-manganese high-aluminum steel can be guaranteed, high-manganese high-aluminum steel continuous casting blanks with excellent surface quality are cast, and multi-heat continuous casting can be realized.
Owner:CHONGQING UNIV

Method and device for improving non-uniform thickness in blade-feeding position during multi-line cutting of silicon chip

The invention discloses a method and device for improving the thickness uniformity in a blade-feeding position during the multi-line cutting of a silicon chip. The device comprises a feeding mechanism, a dovetail groove arranged on the feeding mechanism, a workpiece pressure block for fixing workpieces, the workpieces bonded by adhesives, a glass strip, a workpiece connecting plate and a plurality of insertion pieces, wherein the workpiece pressure block is connected with the workpiece connecting plate, one of the insertion pieces or multiple superimposed insertion pieces are arranged at one end or two ends at the top of the workpiece pressure block and positioned between the top end of the workpiece pressure block and the top wall of the dovetail groove, and the parallelism and the height difference between the feeding initial positions of the workpieces in the same group and a linear mesh contact surface are regulated to be consistent. By measuring and regulating the parallelism of the feeding initial positions of the workpieces and further utilizing the existing feeler gauges in complete specifications to precisely regulate the height difference between the feeding initial positions of the workpieces and the linear mesh contact surface, the invention achieves the purposes of enabling the parallelism between the feeding initial positions of the cut workpieces in the same group and the linear mesh contact surface to be consistent and effectively improving the non-uniform thickness in a blade-feeding position during the multi-line cutting of a silicon chip.
Owner:浙江光益硅业科技有限公司

Support tool structure for painting inner wall of gyration shell

The invention discloses a support tool structure for painting the inner wall of a gyration shell. The support tool structure for painting the inner wall of the gyration shell comprises a support frame, a horizontal guiding support structure, a vertical guiding support structure and a lifting assembly. The support frame is of an L shape as a whole and comprises a base and a vertical frame arrangedon one side of the base. The horizontal guiding support structure is arranged on the base, the rear end of the gyration shell can be supported by the horizontal guiding support structure, and supporting points can translate along the horizontal direction to adapt to gyration shells of different length and diameters through the horizontal guiding support structure. The vertical guiding support structure is arranged on the vertical frame, the front end of the gyration shell can be supported by the vertical guiding support structure, and the supporting points can translate in the vertical direction through the vertical guiding support structure so that the tilting angle of the gyration shell can be adjusted. The lifting assembly is arranged on the vertical frame and used for driving the vertical guiding support structure to move in the vertical direction. By means of the support tool structure for painting the inner wall of the gyration shell, it is guaranteed that the tilting angle of axis of the gyration shell in the painting process does not change, the problem that inner wall paint film thickness is uneven is solved, and in addition, the distance from the cut-off line of paint film to the rear end face of the gyration shell is consistent.
Owner:BEIJING INST OF RADIO METROLOGY & MEASUREMENT

Method for controlling uniformity of substrate oxide layer in manufacture procedure of shallow-channel insulation layer

The invention discloses a method for controlling uniformity of a substrate oxide layer in a manufacture procedure of a shallow-channel insulation layer, which belongs to the technical field of technology of CMOS (complementary metal oxide semiconductor) semiconductor devices. The steps of the method are as follows: growing one more layer of thin film layer while growing a substrate silicon oxide layer, removing a substrate silicon nitride layer, measuring the thickness of the substrate silicon oxide layer after removing the substrate silicon nitride layer, taking the thickness as a front value, simultaneously setting a target value which is the thickness value of the substrate silicon oxide layer under an ideal condition, setting a modification value for the substrate silicon oxide layer in each batch, wherein the value range of the modification value is the difference range of the front value and the target value, and modifying and etching the substrate silicon oxide layer according to the modification value. The method adopting the technical scheme has the benefits that the problem of non-uniform thickness of the substrate oxide layers is improved, the manufacture cost of the semiconductor technology is saved, and the production-manufacturing time of a product is shortened.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Constant-angle speed changing device applied to vapor-phase deposition of coating of blade and control method

The invention discloses a constant-angle speed changing device applied to vapor-phase deposition of a coating of a blade and a control method. The constant-angle speed changing device comprises a servo motor driving circuit, an additional control circuit and a cam; the cam is capable of changing the rotation speed of a blade-rotating servo driving motor, so that the rotation speed of the blade is related to the rotation angle of the blade; when the shielded surface of the blade rotates to the position which directly faces an ionic group, the rotation speed of the blade is reduced; the time for forming the coating by the ionic group is prolonged, so that the thickness of the coating is more uniform. In addition, the constant-angle speed changing device is capable of depositing the area, with unequal thickness requirement, of the blade surface coating; the residence time in the area with relatively high thickness is long; the residence time of the area with relatively low thickness is short; meanwhile, the device is used for depositing and processing the surface coatings of a turbine working blade and a turbine guide blade; the device is also applicable to the deposition coatings of multi-layer (2-5 layers) guide blades. The device is capable of depositing and processing multiple coating systems such as MCrAlY coatings, YSZ coatings, Al2O3 coatings and TiN coatings.
Owner:AECC AVIATION POWER CO LTD

Diffusion furnace

The present invention provides a diffusion furnace, comprising: a reaction chamber extending along a first direction, the reaction chamber having an exhaust end, a plurality of wafers capable of being sequentially arranged along the first direction, the surfaces of the wafers extending along a second direction, the second direction being perpendicular to the first direction or forming an acute angle with the first direction; the gas pipelines penetrate through the side wall of the reaction chamber so as to introduce external reaction gas into the reaction chamber, the gas channels are distributed from the exhaust end in the first direction, and an acute included angle is formed between the axis of each gas channel and the second direction. The reaction gas sprayed from the gas channel can directly reach the center of the wafer through the inclined design of the gas channel, so that the problem that the two sides are thick and the middle is thin in the deposition process is solved, due to the exhaust effect of the exhaust end, the reaction gas reaches the middle of the wafer and diffuses towards the two sides, meanwhile, diffusion of the gas is accelerated through rotation of the wafer boat, and the deposition efficiency is improved. Therefore, the thickness of the film layer deposited at the center and the edge of the surface of the single wafer is more uniform, and the product yield is improved.
Owner:CHANGXIN MEMORY TECH INC

Method for preparing HA-containing biological composite film layer through ultrasonic-assisted titanium alloy micro-arc oxidation hydro-thermal treatment

The invention discloses a preparation method of an HA biological composite film layer through ultrasonic and micro-arc oxidation titanium alloy surface hydro-thermal treatment. The method comprises the following steps: immersing a pretreated titanium alloy as an anode into a biological electrolyte, taking a stainless steel sheet as a cathode, carrying out micro-arc oxidation by using a direct-current pulse power supply and the optimized biological electrolyte, preparing a biological ceramic membrane layer, cleaning a sample, and drying the cleaned sample; and then placing the dried sample in a liner of a hydrothermal reaction kettle, dissolving NaOH into deionized water, adjusting the pH value, pouring the hydrothermal solution into the liner of the reaction kettle, and finally carrying out heat preservation treatment. The biological membrane layer obtained by combining ultrasonic synergistic micro-arc oxidation and hydrothermal treatment has high wear resistance and corrosion resistance of a micro-arc oxidation membrane layer and excellent biological activity of hydroxyapatite, and meanwhile, the ultrasonic synergism has an improvement effect on the thickness, element distribution and the like of the micro-arc oxidation membrane, so that the generation of hydroxyapatite can be promoted; and the morphology and distribution of hydroxyapatite are homogenized.
Owner:江苏通和生物医药科技有限公司

A fixed angle speed change device and control method for blade vapor deposition coating

The invention discloses a constant-angle speed changing device applied to vapor-phase deposition of a coating of a blade and a control method. The constant-angle speed changing device comprises a servo motor driving circuit, an additional control circuit and a cam; the cam is capable of changing the rotation speed of a blade-rotating servo driving motor, so that the rotation speed of the blade is related to the rotation angle of the blade; when the shielded surface of the blade rotates to the position which directly faces an ionic group, the rotation speed of the blade is reduced; the time for forming the coating by the ionic group is prolonged, so that the thickness of the coating is more uniform. In addition, the constant-angle speed changing device is capable of depositing the area, with unequal thickness requirement, of the blade surface coating; the residence time in the area with relatively high thickness is long; the residence time of the area with relatively low thickness is short; meanwhile, the device is used for depositing and processing the surface coatings of a turbine working blade and a turbine guide blade; the device is also applicable to the deposition coatings of multi-layer (2-5 layers) guide blades. The device is capable of depositing and processing multiple coating systems such as MCrAlY coatings, YSZ coatings, Al2O3 coatings and TiN coatings.
Owner:AECC AVIATION POWER CO LTD

A supporting tooling structure for painting the inner wall of a rotary housing

The invention discloses a support tool structure for painting the inner wall of a gyration shell. The support tool structure for painting the inner wall of the gyration shell comprises a support frame, a horizontal guiding support structure, a vertical guiding support structure and a lifting assembly. The support frame is of an L shape as a whole and comprises a base and a vertical frame arrangedon one side of the base. The horizontal guiding support structure is arranged on the base, the rear end of the gyration shell can be supported by the horizontal guiding support structure, and supporting points can translate along the horizontal direction to adapt to gyration shells of different length and diameters through the horizontal guiding support structure. The vertical guiding support structure is arranged on the vertical frame, the front end of the gyration shell can be supported by the vertical guiding support structure, and the supporting points can translate in the vertical direction through the vertical guiding support structure so that the tilting angle of the gyration shell can be adjusted. The lifting assembly is arranged on the vertical frame and used for driving the vertical guiding support structure to move in the vertical direction. By means of the support tool structure for painting the inner wall of the gyration shell, it is guaranteed that the tilting angle of axis of the gyration shell in the painting process does not change, the problem that inner wall paint film thickness is uneven is solved, and in addition, the distance from the cut-off line of paint film to the rear end face of the gyration shell is consistent.
Owner:BEIJING INST OF RADIO METROLOGY & MEASUREMENT

Patch pressurizing device and method for sensor

The invention discloses a patch pressurizing device and method for a sensor. The device comprises a pressure transmission plate, a spring, a guide rod, a fixed base, a positioning plate and a nut, a threaded hole is formed in the fixed base, through holes are formed in the pressure transmission plate and the positioning plate, and the guide rod sequentially penetrates through the threaded hole ofthe fixed base, the through hole of the pressure transmission plate and the through hole of the positioning plate and is fixed by the nut; a patch area of the sensor is clamped between the pressure transmission plate and the positioning plate; and the spring is arranged between the pressure transmission plate and the fixed base. The method comprises the following steps: step 1, fixing the sensor on the positioning plate, and fixing the patch area of the sensor on the pressurizing surface of the positioning plate; 2, screwing the guide rod in the threaded hole in the fixed base, and sequentially arranging the spring, the pressure transmission plate, the positioning plate and the nut on the guide rod to be fixed; and 3, compressing the patch pressurizing spring, generating a gap between thenut and the upper surface of the positioning plate, and tightening the nut to perform pressurizing compensation after the pressurizing force value is stable.
Owner:ZHONGHANG ELECTRONICS MEASURING INSTR

Test piece arrangement structure and test substrate

The invention discloses a test piece arrangement structure and a test substrate. The test piece arrangement structure comprises a plurality of test groups, each test group comprises at least one test piece, the number of the test pieces in each test group is the same, the plurality of test groups are arranged around a virtual mark point, the test pieces are provided with patterned structures, and the patterned structures are arranged around the virtual mark point. Each test group is provided with at least one test piece with the same patterned structure, and the distances from the same patterned structures in the test groups to the virtual mark points are the same. The thickness of the film layer of each patterned structure obtained by performing evaporation by utilizing the evaporation equipment is relatively consistent, so that the thickness uniformity of the evaporation film layer of the same patterned structure of each test group is improved, and the phenomenon that the thickness of the evaporation film layer of the test piece in each test group is not uniform is improved to a certain extent. The test piece has enough film layer precision, so that a more accurate test result can be obtained when the test piece is used for testing.
Owner:WUHAN TIANMA MICRO ELECTRONICS CO LTD
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