The invention relates to a preparation and characterization method for a
precious metal ultrafine wire EBSD
test sample. The comprises the steps: stretching a
precious metal ultrafine wire sample andbonding the
precious metal ultrafine wire sample to the top end of the inclined surface of a double-inclined sample table; placing the precious
metal ultrafine wire sample in a sample bin to select asample section preparation and test area; tilting the sample table, carrying out carbon plating treatment,
ion beam
cutting and
ion beam surface
polishing treatment on the sample in the field of viewto obtain a cross section observation sample of the
noble metal ultrafine wire without
surface stress, and observing and obtaining a
microstructure morphology image of a wire cross section observationarea through
ion beam channel
contrast imaging; tilting the double-tilting sample table until the angle between the observation section and the incident
electron beam is 70 degrees, and performing
electron back scattering
diffraction detection on the section of the ultrafine wire through a
CCD detector to obtain an EBSD image and a
crystallography signal of the section of the sample micro-area. The EBSD and the
ion beam channel contrast image are combined to provide more systematic and comprehensive data support for
microcell analysis of precious
metal ultrafine wires, and the comprehensive analysis range of samples can be expanded.