This application provides a weak
dark current testing device, comprising: a housing; a test socket disposed within the housing for supporting and electrically connecting one or more devices under test (DUTs) to collect
dark current signals generated by the DUTs; a channel interface disposed on the housing for connecting to external
testing equipment; a channel switching module disposed within the housing and connected to both the test socket and the channel interface, forming a
dark current signal path from the DUTs to the external
testing equipment; and the channel switching module selectively conducting the dark current
signal path, enabling dark current testing of different DUTs through the external
testing equipment. This application, through the channel switching module, time-division multiplexes the dark current
signal paths between each DUT and the external testing equipment, sequentially completing the dark current testing of each DUT, thereby improving the efficiency of dark current testing.