4results about How to "Precise operation" patented technology

The embodiment of the invention discloses a semiconductor test structure and a thickness measurement method. The semiconductor test structure comprises a substrate, wherein a groove is formed in the substrate; the epitaxial layer is formed based on the groove, and the epitaxial layer comprises a buffer layer, a seed crystal layer and a silicon cap layer which are stacked in sequence; the buffer layer covers the bottom surface of the groove; the seed crystal layer is in a convex shape and is positioned above the buffer layer; the silicon cap layer is positioned above the seed crystal layer and covers the convex part of the seed crystal layer; and the combination of the silicon cap layer and the seed crystal layer is in a halfpace shape protruding above the opening of the groove. According to the semiconductor test structure and the thickness measurement method provided by the embodiment of the invention, the size information of each layer in the epitaxial layer can be quickly and accurately obtained.

This invention relates to the field of comprehensive utilization technology of lithium battery test data, and discloses a method, system, equipment, and medium for comprehensive calculation of lithium battery test data. In the finished product testing stage, a unique identifier is generated for each battery cell and bound to the test task; raw test data is collected in real time and stored in a strong association with the identifier, forming a record with the individual battery as the primary key; a hierarchical association model is constructed to represent the relationship between finished product packages or modules and individual battery cells; in response to traceability query requests, the set of identifiers of all associated individual batteries is determined according to the model, and the corresponding test data is extracted and comprehensively calculated using these identifiers as keys; the traceability analysis results are visualized and downloaded. This invention solves the problems of lacking an individual-level data association model and being unable to efficiently trace individual battery test data, improving data utilization efficiency and the ability to locate quality problems.

The invention relates to the field of industrial internet of things, in particular to a data quality evaluation and abnormal root cause analysis method and system based on the internet of things, a terminal and a medium, and the method comprises the steps: collecting monitoring data, and calling a dynamic threshold value for preprocessing based on a business scene type; inputting the data into the optimized isolation forest basic model for preliminary screening, and outputting normal and suspected abnormal data sets; constructing an equipment association graph and a node feature matrix by using the equipment spatio-temporal topological relation and the suspected abnormal data set, inputting the graph convolutional network enhancement model for secondary verification, eliminating pseudo anomalies, and outputting a final abnormal data set; the normal data and the pseudo-abnormal data are merged into an effective normal data stream, and multi-dimensional quality evaluation is carried out; and constructing a feature mode vector based on the final abnormal data set, matching the feature mode vector with a power equipment knowledge base, and determining an equipment fault type. According to the invention, data quality evaluation and abnormal root cause positioning are realized, and the data management operation and maintenance efficiency of the Internet of Things is improved.

The utility model discloses a device for researching functional special paint, which relates to the field of special paint research, and comprises an operating table, a sample comparison area, a drop hammer impact structure and a sample placing plate, the top of the operating table is a table top, one side of the table top is provided with the sample comparison area, the sample comparison area is arranged on one side of the table top, and the sample placing plate is arranged on the other side of the table top. A drop hammer impact structure is arranged on the other side of the table top, and the sample placing plate is located at the bottom of the drop hammer impact structure. According to the utility model, the state change is realized by virtue of the cooperative operation of the operating platform, the drop hammer impact structure and other parts. When the impact resistance of the coating is detected, the drop hammer impact structure can always accurately operate, and the guide rail has a stable limiting effect on the drop hammer in the impact process, so that the preciseness and accuracy of the impact test are ensured, and meanwhile, the operation, regulation and control are convenient.