The application provides a
chip ESD
repair method,
system and storage medium based on via optimization, locates a failure point based on a
chip ESD test result, determines corresponding ESD protection devices and
discharge paths, screens via defects in combination with a
layout design file to mark defect points, formulates a via optimization strategy for each
discharge path according to the defect points, performs via supplement and through operation according to the optimization strategy, performs symmetry checking on each
discharge branch of the ESD protection devices and adjusts a via
layout, and outputs a repaired
layout after performing
design rule checking and electrical
rule checking on the optimized layout. The application realizes impedance reduction of the discharge path through via supplement and through operation, realizes current balance of each
branch through symmetry checking, and does not need to change the original
circuit architecture, and gives consideration to ESD protection
performance improvement and high-speed
signal integrity maintenance.