The invention discloses a device for testing residence time distribution (RTD) of a material. The device comprises a lighting tube, an optical window, a fluorescence detector, a signal processing unit, an excitation light source, a transflective mirror, a light source power supply unit and the like, wherein the beam emitted from the excitation light source strikes a detected material after passing through the transflective mirror; a tracer in the detected material is excited to emit fluorescence which is transmitted to the fluorescence detector after passing through the transflective mirror; and through the analysis of the signal processing unit, the RTD of the material is calculated. The device for testing the RTD of the material has the advantages of capability of greatly reducing coupling loss and cost because the excitation beam and the fluorescence do not need coupling to an optical fiber in the emitting process, compact light path arrangement, small volume, very convenient use by only being electrically connected with the signal processing unit and the light source power supply unit and capability of conveniently isolating the detected material from the high-temperature and high-pressure environment.