The application relates to a large-aperture KDP
crystal micro-defect
rapid detection and positioning method based on variable
magnification ring
magnification conversion, and relates to the technical field of
optical engineering, and aims to solve the problems of low scanning efficiency, low image
imaging quality and easy image missing of the existing method. The application adopts a
feature point matching method based on a simulated CMT tracking
algorithm to determine the
conversion coefficients under each variable
magnification ring magnification, and further calculates the actual
field of view range of the scanning
microscope under different magnifications; through edge-seeking motion, the edge image of the element is extracted to determine the element center coordinate value, and the
crystal global coordinate conversion is realized; based on the low-magnification scanning
microscope, a grid format reciprocating scanning strategy is adopted to scan the micro-defects on the surface of the whole
crystal element, and the micro-defects on the surface of the element are positioned based on the medium-magnification scanning
microscope; during the scanning and positioning of the micro-defects on the surface of the crystal element, an
image processing method based on a gradient
algorithm is adopted, and finally the position, shape and size information of each micro-defect are obtained quickly and accurately.