2results about How to "Meet different measurement needs" patented technology

The application discloses a kind of stimulating coil magnetic field measuring devices.The device includes: at least two magnetic field detection units;Magnetic field detection unit includes at least one magnetic field detection element;Wherein the number of magnetic field detection element in different magnetic field detection units and arrangement are different;Holder is used to clamp one of at least two magnetic field detection units, or, for clamping stimulating coil;Position movement module is connected with holder, for controlling holder moves;During the process of holder movement, the relative position of magnetic field detection unit and stimulating coil changes;Stimulating coil magnetic field measuring device measures the magnetic field of different regions of stimulating coil by one of at least two magnetic field detection units.The magnetic field measuring device in the application is simple in structure, and different measurement requirements for stimulating coil magnetic field can be realized by replacing different magnetic field detection units, to realize the multifunctionality of magnetic field measuring device.

The application relates to the technical field of three-dimensional topography measurement, in particular to a microscopic device, which has a first measurement mode and a second measurement mode. In the first measurement mode, the first measurement mode can be combined by a first illumination module, a first objective lens and an image acquisition module, and the measurement of a measured object can be realized by adopting the interference mode of first detection light and first reference light in an imaging light path. In the second measurement mode, the second measurement mode can be combined by a second illumination module, a second objective lens and an image acquisition module, and the measurement of the measured object can be realized by adopting second illumination light with a predetermined coding pattern in the same imaging light path. Thus, different measurement modes can be adopted according to user requirements, the same image acquisition module and the same imaging light path can be used to meet different measurement requirements of the measured object, the microscopic device has multiple functions, and the cost of the microscopic device and the cost of various types of measurement are reduced.