The utility model relates to power
semiconductor's test technical field especially, and more particularly to a kind of double-
pulse test structure of power
semiconductor, the structure includes: laminated
busbar and the
protection mechanism being set on the laminated
busbar;The
protection mechanism includes: switch tube, auxiliary
diode, first accommodating groove and second accommodating groove;The switch tube is connected with the auxiliary
diode, the first accommodating groove and the second accommodating groove are all set on the laminated
busbar, the switch tube is located in the first accommodating groove, the auxiliary
diode is located in the second accommodating groove.By the structure, avoid the failure of the
device under test when double-
pulse test is carried out to the
device under test to exert larger
voltage and current, to avoid making the test loop be in short-circuit uncontrollable state, test loop current is constantly increasing until the device burns, prevent the entire test
system from burning, improve the reliability and security in the double-
pulse test process to the
device under test.