Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

67 results about "Cathodoluminescence" patented technology

Cathodoluminescence is an optical and electromagnetic phenomenon in which electrons impacting on a luminescent material such as a phosphor, cause the emission of photons which may have wavelengths in the visible spectrum. A familiar example is the generation of light by an electron beam scanning the phosphor-coated inner surface of the screen of a television that uses a cathode ray tube. Cathodoluminescence is the inverse of the photoelectric effect, in which electron emission is induced by irradiation with photons.

Systematic characterization method for relation between defects of photovoltaic detection materials and performance of devices

The invention relates to a systematic characterization method for the relation between the defects of photovoltaic detection materials and the performance of devices, which includes the following steps: according to the variety and characteristics of a photovoltaic detection material, a test chip is designed and packaged to form a test sample; the photoelectric characteristics of the test sample are measured and characterized; on the same test sample, an electron beam-induced current / scanning electron microscope or cathodoluminescence / scanning electron microscope combination-combined method is used for carrying out the measurement, characterization and statistical analysis of performance-related defects; and according to the directly related test characterization result obtained in the previous step, systematic characterization is carried out on the relation between the defects of the material and the performance of the device. The systematic characterization method can prevent the problems of uncertainty and randomness existing in the relation between the performance of the device made from the material and the measured defects of the material.
Owner:SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI

Method for discriminating redox property of ore-forming fluid based on cathodoluminescence characteristic of scheelite in quartz vein type deposit

The invention provides a method for discriminating the redox property of an ore-forming fluid based on the cathodoluminescence characteristic of scheelite in a quartz vein type deposit. The method comprises the following steps: obtaining multiple scheelite samples; choosing scheelite particles based on the mineralogy, the morphology and the output characteristics of the scheelite particles in thescheelite samples in order to obtain high-quality scheelite particles; obtaining the scanning electron microscopy-cathodoluminescence images and the back scattering images of the high-quality scheelite particles; dividing the high-quality scheelite particles based on the scanning electron microscopy-cathodoluminescence images and the back scattering images according to the morphology and internalstructural characteristics of the scheelite particles in order to obtain multiple types of the high-quality scheelite particles; carrying out in-situ analysis on rare earth elements in the multiple types of the high-quality scheelite particles to obtain europium content and molybdenum content data; and establishing an element distribution map according to the europium content and molybdenum content data, wherein the element distribution map is used for indicating the redox property of the ore-forming fluid for forming the scheelite.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

Discrimination method of redox property of ore-forming fluid based on cathodoluminescence characteristics of scheelite in porphyry deposit

The invention provides a method based on the cathode luminescence feature of scheelite in a porphyry deposit and used for distinguishing the redox properties of an ore-forming fluid. The method includes: acquiring a plurality of scheelite samples; selecting scheelite particles on the basis of the mineralogy, morphology and production features of the scheelite particles in the scheelite samples toobtain high-quality scheelite particles; acquiring the scanning electron microscope-cathode luminescence image and back scattering image of the high-quality scheelite particles; based on the scanningelectron microscope-cathode luminescence image and the back scattering image, dividing the high-quality scheelite particles according to the morphology and internal structural features of the scheelite particles to obtain a plurality types of high-quality scheelite particles; performing in-situ analysis on rare-earth elements in the plurality types of high-quality scheelite particles to obtain europium content and molybdenum content data; calculating europium anomaly according to the europium content data, and building an element distribution diagram according to the europium anomaly and the molybdenum content data, wherein the element distribution diagram is used for indicating the redox properties of the ore-forming fluid of the scheelite.
Owner:CHINA UNIV OF GEOSCIENCES (WUHAN)

In-situ characterization method for nano wires

The invention provides an in-situ characterization method utilizing SEM-CL (Scanning Electron Microscopy-Cathodoluminescence) and a TEM (Transmission Electron Microscope). The method comprises the following steps: 1) providing a micro grid; 2) forming a conducting layer on the surface of the micro grid; 3) placing nano wires on the surface of the conducting layer and fixing the nano wires on the surface of the conducting layer by utilizing an adhesive; 4) utilizing a scanning electronic microscope to select a single nano wire, shooting the specific morphology of the single nano wire and recording the size of the single nano wire; 5) utilizing a cathode fluorescence testing device to record the luminance of different positions of the single nano wire, and utilizing the line scanning function of the cathode fluorescence testing device to calibrate a second mark on the single nano wire; and 6) utilizing a transmission electron microscope to record the structural information of the second mark on the single nano wire. According to the invention, a special fine sampling and testing method is utilized, the structural information obtained by the TEM is directly related with the luminescence obtained by the SEM-CL, and a bridge between a nano structure of a material and the luminescence of the material is constructed.
Owner:SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI +1
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products