The invention relates to a rapid evaluation method for high-temperature
energy storage characteristics and failure behaviors of a
dielectric film, and belongs to the technical field of performance testing of electrical insulating materials. The method comprises the following steps: placing a
dielectric film sample in a closed
temperature control environment, applying stage step boosting until breakdown, and collecting a leakage current curve under each stable
voltage until the sample is broken down; analyzing a Weibull distribution scale parameter alpha and a Weibull distribution shape parameter beta of the breakdown
field intensity at different temperatures, an inflection point
electric field in the leakage current curve and
current density J under preset
field intensity, and drawing alpha-T, beta-T and eta-T change curves; and finally, determining the
temperature resistance grade, the insulation degradation temperature and the leakage current surge temperature of the material by taking the characteristic breakdown
field strength, namely a scale parameter alpha, a shape parameter beta, an inflection point
electric field in a leakage current curve and the temperature corresponding to the temperature surge position of the charging and discharging efficiency eta as characteristic criteria. According to the method, the multi-dimensional high-temperature performance parameters of the material are obtained in a
single test process, and the problem that a traditional method is low in efficiency is solved.